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Christophe Kelma
Observed names:
C. Kelma,
Kelma, C.,
Kelma, Christophe
Observed institutions:
NXP (Netherlands),
NXP (Germany),
Philips (France)
OpenAlex ID:
A5087174545
Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing
2006
·
Sofiane Ellouz
, Patrice Gamand
, et al.
·
IEEE International Test Conference (ITC)
·
54
Sensors for built-in alternate RF test
2010
·
Louay Abdallah
, Haralampos-G. Stratigopoulos
, et al.
·
IEEE European Test Symposium (ETS)
·
50
Smart selection of indirect parameters for DC-based alternate RF IC testing
2012
·
Haithem Ayari
, Florence Azais
, et al.
·
IEEE VLSI Test Symposium (VTS)
·
41
Experiences with non-intrusive sensors for RF built-in test
2012
·
Louay Abdallah
, Haralampos-G. Stratigopoulos
, et al.
·
IEEE International Test Conference (ITC)
·
40
RF Front-End Test Using Built-in Sensors
2011
·
Louay Abdallah
, Haralampos-G. Stratigopoulos
, et al.
·
IEEE Design & Test of Computers
·
25
Wideband UHF ISM-band transceiver supporting multichannel reception and DSSS modulation
2013
·
Jan van Sinderen
, Gerben W. de Jong
, et al.
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
21
Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement
2011
·
Sidina Wane
, Manohiaina Ranaivoniarivo
, et al.
·
Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium
·
8
Design and characterization of an integrated microwave generator for BIST applications
2014
·
Imene Lahbib
, Mohamed Aziz Doukkali
, et al.
·
International Journal of Microwave and Wireless Technologies
·
4
Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm
2011
·
Sebastien Darfeuille
, Christophe Kelma
·
European Conference on Circuit Theory and Design
·
2
Built-in Self Test for Error Vector Magnitude measurement of RF transceiver
2009
·
Bilal El Kassir
, Christophe Kelma
, et al.
·
IEEE International Test Conference (ITC)
·
2
Design of a K-band wideband controlled variable attenuator for microwave Built-In-Self-Test applications
2013
·
Imene Lahbib
, Philippe Descamps
, et al.
·
Mediterranean Microwave Symposium
·
1
Design of an embedded RF signal generator for BIST application
2013
·
Imene Lahbib
, Mohamed-Aziz Doukkali
, et al.
·
IEEE International New Circuits and Systems Conference (NEWCAS)
·
1
RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology
2013
·
Christophe Kelma
, Sebastien Darfeuille
, et al.
·
IEEE European Test Symposium (ETS)
·
1
A new methodology for optimal RF DFT sensor design
2012
·
Conrado K. Mesadri
, Aziz Doukkali
, et al.
·
International Journal of Microwave and Wireless Technologies
·
1
Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems
2011
·
S. Wane
, M. Ranaivoniarivo
, et al.
·
URSI General Assembly and Scientific Symposium
·
1
Capteurs embarqués pour le test alternatif des circuits RF
2010
·
Abdallah, L.
, Stratigopoulos, Haralampos-G
, et al.
·
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Works count:
17
Citation count:
252
H-index:
7
I10-index:
6
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