Work

Sensors for built-in alternate RF test

Year: 2010

Type: conference-paper

Source: IEEE European Test Symposium (ETS)

DOI: 10.1109/etsym.2010.5512783

Authors: Louay Abdallah, Haralampos-G. Stratigopoulos, Christophe Kelma, Salvador Mir

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2108939487

FWCI: 3.954

Cites: 17

Cited by: 50

Related to: 10