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Louay Abdallah

Sensors for built-in alternate RF test
2010 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE European Test Symposium (ETS) · 50
Experiences with non-intrusive sensors for RF built-in test
2012 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE International Test Conference (ITC) · 40
Defect-oriented non-intrusive RF test using on-chip temperature sensors
2013 · L. Abdallah, H. Stratigopoulos, et al. · IEEE VLSI Test Symposium (VTS) · 39
RF Front-End Test Using Built-in Sensors
2011 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE Design & Test of Computers · 25
Fast Deployment of Alternate Analog Test Using Bayesian Model Fusion
2015 · John Liaperdos, Haralampos-G. Stratigopoulos, et al. · Design, Automation, and Test in Europe · 17
Testing RF circuits with true non-intrusive built-in sensors
2012 · L. Abdallah, H-G Stratigopoulos, et al. · Design, Automation, and Test in Europe · 15
True non-intrusive sensors for RF built-in test
2013 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · IEEE International Test Conference (ITC) · 13
Adaptive logical control of RF LNA performances for efficient energy consumption
2010 · Rafik Khereddine, Louay Abdallah, et al. · IEEE/IFIP International Conference on VLSI and System-on-Chip (VLSI-SoC) · 10
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning
2018 · Parth Kansara, Sharanabasavaraja Bheema Reddy, et al. · Journal of Electronic Testing · 6
Accurate estimation of analog test metrics with extreme circuits
2012 · Kamel Beznia, Ahcene Bounceur, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 6
Multivariate statistical techniques for analog parametric test metrics estimation
2013 · Ke Huang, H-G Stratigopoulos, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 5
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Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors
2015 · Athanasios Dimakos, Martin Andraud, et al. · IEEE Computer Society Annual Symposium on VLSI · 4
Low-cost EVM built-in test of RF transceivers
2014 · Ayssar Serhan, Louay Abdallah, et al. · International Design and Test Workshop (IDT) · 4
Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption
2012 · Rafik Khereddine, Louay Abdallah, et al. · IFIP International Federation for Information Processing/IFIP · 3
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On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study
2011 · Alexios Spyronasios, Louay Abdallah, et al. · Proceedings - Asian Test Symposium/Proceedings · 3
Evaluation of built-in sensors for RF LNA response measurement
2010 · J. Tongbong, L. Abdallah, et al. · IEEE International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) · 3
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes
2014 · J. Altet, E. Aldrete-Vidrio, et al. · IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) · 2
Analog/RF Circuit Aging Prediction based on On-Chip Machine Learning
2023 · Ke Huang, Louay Abdallah · International Conference on Artificial Intelligence and Big Data (ICAIBD) · 1
Implicit test of high-speed analog circuits using non-intrusive sensors
2011 · Louay Abdallah, Haralampos-G. Stratigopoulos, et al. · European Conference on Circuit Theory and Design · 1
Capteurs embarqués non-intrusifs pour le test des circuits RF
2012 · Louay Abdallah · theses.fr (ABES)
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Conception et évaluation d'une technique de test pour un mélangeur RF
2011 · Abdallah, L., Stratigopoulos, Haralampos-G, et al. · HAL
Moniteurs embarqués pour le test à bas coût d'un front-end RF
2011 · Abdallah, L., Stratigopoulos, Haralampos-G, et al. · HAL
Capteurs embarqués pour le test alternatif des circuits RF
2010 · Abdallah, L., Stratigopoulos, Haralampos-G, et al. · HAL
Alternate LNA testing using an envelope detector
2009 · Abdallah, L., Tongbong, J., et al. · HAL
Works count: 25
Citation count: 247
H-index: 8
I10-index: 8
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