Work

On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study

Year: 2011

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats.2011.44

Authors: Alexios Spyronasios, Louay Abdallah, Haralampos-G. Stratigopoulos, Salvador Mir

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Aristotle University of Thessaloniki, Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1978721083

FWCI: 0.186

Cites: 12

Cited by: 3

Related to: 10