Work

Capteurs embarqués pour le test alternatif des circuits RF

Year: 2010

Type: conference-paper

Source: HAL

Authors: Abdallah, L., Stratigopoulos, Haralampos-G, Kelma, C., Mir, Salvador

Institutions: Techniques of Informatics and Microelectronics for Integrated Systems Architecture, NXP (Netherlands), NXP (Germany)

Language: French

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4296928152

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Related to: 10