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A. M. Mazzone
Observed names:
A M Mazzone,
A. M Mazzone,
A. M. MAZZONE,
A. Mazzone,
A.M Mazzone,
A.M. MAZZONE,
A.M. Mazzone
show all 7
Observed institutions:
University of Modena and Reggio Emilia,
Bologna Research Area,
National Research Council,
University of Bologna
OpenAlex ID:
A5088481221
Current transport in narrow-base transistors
1977
·
G. Baccarani
, C. Jacoboni
, et al.
·
Solid-State Electronics
·
92
Defect distribution in ion-implanted silicon. A Monte Carlo simulation
1986
·
A. M. Mazzone
·
physica status solidi (a)
·
90
Influence of impurities and crystalline defects on electron mobility in heavily doped silicon
1979
·
M. Finetti
, R. Galloni
, et al.
·
Journal of Applied Physics
·
30
Monte Carlo simulation of current transport in forward-biased Schottky-barrier diodes
1976
·
G. Baccarani
, A.M. Mazzone
·
Electronics Letters
·
30
Properties of pure and compound clusters of Si, Ge, and Pb
1996
·
A. M. Mazzone
·
Physical review. B, Condensed matter
·
29
Three-Dimensional Monte Carlo Simulations--Part I: Implanted Profiles for Dopants in Submicron Device
1984
·
A.M. Mazzone
, G. Rocca
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
21
The diffuse scattering model of effective mobility in the strongly inverted layer of MOS transistors
1974
·
G. Baccarani
, A.M. Mazzone
, et al.
·
Solid-State Electronics
·
20
5 keV to 2 MeV lithium implantation and diffusion in amorphous silicon
1989
·
D. Fink
, J. P. Biersack
, et al.
·
Radiation effects and defects in solids
·
17
Defect distribution in ion implanted silicon: comparison between Monte Carlo simulation and triple crystal X-ray measurements
1987
·
M. Servidori
, P. Zaumseil
, et al.
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
·
17
Three-Dimensional Monte Carlo Simulations--Part II: Recoil Phenomena
1985
·
A.M. Mazzone
·
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
·
15
On the diffusion current in heavily doped semiconductors
1975
·
G. Baccarani
, A.M. Mazzone
·
Solid-State Electronics
·
13
Comparison of experimental and theoretical carrier concentrations in heavily doped n-type silicon
1976
·
M. Finetti
, A. M. Mazzone
, et al.
·
Journal of Applied Physics
·
12
Boron impurities on a vicinal Si(100) surface: A study of structural properties and binding energies
2002
·
A. M. Mazzone
·
Philosophical Magazine Letters
·
11
Monte Carlo simulation of two-dimensional distributions of implanted ions in a crystalline silicon target
1988
·
A.M. Mazzone
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
·
11
Molecular dynamics simulation of the damage formed in silicon at energies near threshold
1988
·
A.M. Mazzone
·
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
·
11
On anomalous channelling effects in ion-implanted silicon
1987
·
A. M. Mazzone
·
Philosophical Magazine Letters
·
9
Impurity effects on conduction in heavily doped n-type silicon
1977
·
M. Finetti
, A. M. Mazzone
·
Journal of Applied Physics
·
9
Bond hybridization and structural properties of clusters of group-IV elements
1997
·
A. M. Mazzone
·
Physical review. B, Condensed matter
·
8
Properties of clustered interstitials in ion-implanted silicon: Comparison between a Monte Carlo simulation and x-ray diffraction measurements
1988
·
A. M. Mazzone
, M. Servidori
·
Philosophical Magazine Letters
·
8
Transferred-electron oscillators at very high frequencies
1981
·
A.M. Mazzone
, H.D. Rees
·
Electronics Letters
·
8
Defects in irradiated metallic (Au and Ag) and semiconducting (Si) targets simulated by molecular dynamics
1994
·
A. M. Mazzone
·
Philosophical Magazine Letters
·
7
Molecular Dynamics Simulations of Low Energy Displacement Cascades in Silicon.
1988
·
A. M. Mazzone
·
MRS Proceedings
·
7
Channeling in GaAs. A Monte Carlo Simulation of low Energy Implants
1986
·
F. Garofalo
, A. M. Mazzone
·
physica status solidi (a)
·
7
Temperature dependent conductivity of closely compensated phosphorus-doped silicon
1977
·
M. Finetti
, A. M. Mazzone
, et al.
·
Philosophical magazine
·
7
Characterization of Lattice Damage in Ion Implanted Silicon: Monte Carlo Simulation Combined with Double Crystal X-Ray Diffraction
1985
·
F. Cembali
, A. M. Mazzone
, et al.
·
physica status solidi (a)
·
6
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Works count:
120
Citation count:
646
H-index:
12
I10-index:
15
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