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Frederic Roger
Observed name:
F. Roger
Institution:
AMS (Austria)
Observed institutions:
TU Wien,
AMS (Austria),
Commissariat à l'Énergie Atomique et aux Énergies Alternatives,
CEA Grenoble,
AMS (Germany),
Laboratoire d'Électronique des Technologies de l'Information,
Silvaco Group, Inc. (United States)
show all 7
ORCID:
0000-0002-0746-3249
Observed ORCID:
0000-0002-0746-3249
OpenAlex ID:
A5102817405
Through Silicon Via Reliability
2012
·
Cathal Cassidy
, Jochen Kraft
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
56
A 10-GB/s SONET-compliant CMOS transceiver with low crosstalk and intrinsic jitter
2004
·
H. Werker
, S. Mechnig
, et al.
·
IEEE Journal of Solid-State Circuits
·
29
A 200mW 100MHz-to-4GHz 11th-order complex analog memory polynomial predistorter for wireless infrastructure RF amplifiers
2013
·
F. Roger
·
Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference
·
15
Intrinsic stress analysis of tungsten-lined open TSVs
2015
·
Lado Filipovic
, Anderson Pires Singulani
, et al.
·
Microelectronics Reliability
·
13
A comprehensive solution for simulating ultra-shallow junctions: From high dose/low energy implant to diffusion annealing
2005
·
F. Boucard
, F. Roger
, et al.
·
Materials Science and Engineering B
·
13
Coupled simulation to determine the impact of across wafer variations in oxide PECVD on electrical and reliability parameters of through-silicon vias
2014
·
E. Baer
, P. Evanschitzky
, et al.
·
Microelectronic Engineering
·
11
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes
2024
·
Paul Stampfer
, Frederic Roger
, et al.
·
IEEE Transactions on Device and Materials Reliability
·
10
PDF
Process variation aware ESD design window considerations on a 0.18μm analog, mixed-signal high voltage technology
2011
·
Frederic Roger
, Wolfgang Reinprecht
, et al.
·
Electrical Overstress/Electrostatic Discharge Symposium
·
10
Impact of Trap States at Deep Trench Sidewalls on the Responsivity of Island Photodiodes
2023
·
Paul Stampfer
, Frederic Roger
, et al.
·
IEEE Transactions on Electron Devices
·
8
PDF
Global statistical methodology for the analysis of equipment parameter effects on TSV formation
2015
·
Frederic Roger
, Anderson Singulani
, et al.
·
6
Effects of sidewall scallops on open tungsten TSVs
2014
·
L. Filipovic
, R.L. de Orio
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
6
An EBIC Model for TCAD Simulation to Determine the Surface Recombination Rate in Semiconductor Devices
2016
·
Andrea Kraxner
, Frederic Roger
, et al.
·
IEEE Transactions on Electron Devices
·
5
Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology
2018
·
Filip Segmanovic
, Frederic Roger
, et al.
·
International Convention on Information and Communication Technology, Electronics and Microelectronics
·
4
Impact of source/drain and bulk engineering on LFN performance of n- and p-MOSFET
2017
·
E.G. Ioannidis
, K. Rohracher
, et al.
·
Solid-State Electronics
·
3
TCAD study of Single Photon Avalanche Diode on 0.35μm high voltage technology
2013
·
Frederic Roger
, Jordi Teva
, et al.
·
International Conference on Simulation of Semiconductor Processes and Devices
·
3
Advanced interconnect scheme analysis: real impact of technological improvements
1998
·
G. Lecarval
, Y. Morand
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
3
Evaluation of the Radiation Hardness of Photodiodes in 180-nm CMOS Technology for Medical Applications
2021
·
Filip Segmanovic
, Gerald Meinhardt
, et al.
·
IEEE Transactions on Nuclear Science
·
2
Impact of across-wafer variation on the electrical performance of TSVs
2016
·
L. Filipovic
, S. Selberherr
, et al.
·
IEEE International Interconnect Technology Conference (IITC)
·
2
Towards probabilistic analog behavioral modeling
2015
·
Andre Lange
, Ihor Harasymiv
, et al.
·
IEEE International Symposium on Circuits and Systems proceedings
·
2
New calibration method of analytical models for ion implantation
2002
·
F. Roger
, P. Scheiblin
, et al.
·
International Workshop on Statistical Metrology (IWSM)
·
2
A DLTS study on Deep Trench Processing induced Trap States in Silicon Photodiodes
2023
·
Paul Stampfer
, Bernhard Stampfer
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
1
Optical and Electrical Simulations of Radiation-Hard Photodiode in 0.35μM High-Voltage CMOS Technology
2018
·
Filip Segmanovic
, Frederic Roger
, et al.
·
International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS)
·
1
PDF
Modeling of geometrically scalable integrated finger diodes
2014
·
V. Kosel
, F. Roger
, et al.
·
International Conference on Advanced Semiconductor Devices and Microsystems
·
1
Investigations on CMOS photodiodes using scanning electron microscopy with electron beam induced current measurements
2014
·
A. Kraxner
, F. Roger
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Three-dimensional simulation for the reliability and electrical performance of through-silicon vias
2014
·
L. Filipovic
, F. Rudolf
, et al.
·
International Conference on Simulation of Semiconductor Processes and Devices
·
1
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Works count:
32
Citation count:
209
H-index:
8
I10-index:
8
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