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Andres Torres
Observed institutions:
Siemens (United States),
Mentor Graphics (United States)
ORCID:
0000-0002-7906-1839
Observed ORCID:
0000-0002-7906-1839
OpenAlex ID:
A5103082793
Improved modeling performance with an adapted vectorial formulation of the Hopkins imaging equation
2003
·
Konstantinos Adam
, Yuri Granik
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
33
Advanced multi-patterning and hybrid lithography techniques
2016
·
Fedor G Pikus
, Andres Torres
·
Asia and South Pacific Design Automation Conference (ASP-DAC)
·
12
Model-based insertion and optimization of assist features with application to contact layers
2005
·
Shumay D. Shang
, Yuri Granik
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
9
Double-patterning decomposition, design compliance, and verification algorithms at 32nm hp
2008
·
Alexander Tritchkov
, Petr Glotov
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
7
Automotive Process Reliability Prediction for 5,7nm using ML
2023
·
Srividya Jayaram
, Hyung Joo Lee
, et al.
·
ASMC proceedings
·
5
AI-guided reliability diagnosis for 5,7nm automotive process
2023
·
Dongin Kim
, Hyung Joo Lee
, et al.
·
Metrology, Inspection, and Process Control XXXVI
·
4
Reliability Prediction for Automotive 5nm and 7nm Technology node by using Machine Learning based Solution
2023
·
Hyung Joo Lee
, Dongin Kim
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
4
Virtual metrology: how to build the bridge between the different data sources
2021
·
Stefan Schueler
, Carsten Hartig
, et al.
·
Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV
·
4
Process, design rule, and layout co-optimization for DSA based patterning of sub-10nm Finfet devices
2017
·
Joydeep Mitra
, Andres Torres
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Contrast-based assist feature optimization
2002
·
Andres Torres
, Yuri Granik
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
Model-based guiding pattern synthesis for on-target and robust assembly of via and contact layers using DSA
2017
·
Joydeep Mitra
, Andres Torres
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Physically based compact models for fast lithography simulation
2005
·
Neal Lafferty
, Kostas Adam
, et al.
·
Optical Microlithography XVIII
·
2
Model-based guiding pattern synthesis for robust assembly of contact layers using directed self-assembly
2018
·
Joydeep Mitra
, Andres Torres
, et al.
·
Journal of Micro/Nanopatterning Materials and Metrology
Nanolithography of cylinder forming block copolymers via DSA for semiconductor manufacturing
2017
·
Yuri Granik
, Andres Torres
·
Molecular Systems Design & Engineering
Validation of improved compact model in grapho-epitaxy Directed-Self-Assembly (DSA)
2015
·
Germain Fenger
, Joost Bekaert
, et al.
Advanced techniques for design assembly and characterization for the 14nm node with LFD using a black box API
2012
·
Juliann Opitz
, Andres Torres
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
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Works count:
16
Citation count:
91
H-index:
5
I10-index:
2
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