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Mao-Chyuan Tang

Investigation of Reliability Characteristics in NMOS and PMOS FinFETs
2008 · Wen-Shiang Liao, Yie-Gie Liaw, et al. · IEEE Electron Device Letters · 39
PMOS Hole Mobility Enhancement Through SiGe Conductive Channel and Highly Compressive ILD- $\hbox{SiN}_{x}$ Stressing Layer
2008 · Wen-Shiang Liao, Yue-Gie Liaw, et al. · IEEE Electron Device Letters · 27
Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement
2008 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · IEEE Transactions on Electron Devices · 11
A Nondestructive Method of Extracting the Width and Thickness of Interconnects for a 40-nm Technology
2009 · Mao-Chyuan Tang, Chin-Chuan Cheng, et al. · IEEE Transactions on Electron Devices · 4
Hot-Carrier and Fowler–Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
2009 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · IEEE Transactions on Electron Devices · 4
Effects of Hot Carriers on DC and RF Performances of Deep Submicron p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors with Various Oxide Layer Thicknesses
2008 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · Japanese Journal of Applied Physics · 2
Systematic Analysis and Modeling of On-Chip Spiral Inductors for Complementary Metal Oxide Semiconductor Radio Frequency Integrated Circuits Applications
2006 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · Japanese Journal of Applied Physics · 2
Improved Characterization Methodology of Gate-Bulk Leakage and Capacitance for Ultrathin Oxide Partially Depleted SOI Floating-Body CMOS
2011 · David C. Chen, Ryan Lee, et al. · IEEE Transactions on Semiconductor Manufacturing · 1
Logic 90 nm n-Channel Field Effect Transistor Current and Speed Enhancements Through External Mechanical Package Straining
2008 · Wen-Shiang Liao, Sheng-Yi Huang, et al. · Japanese Journal of Applied Physics · 1
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Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain
2008 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · Journal of Physics D Applied Physics
Improvement of 90nm technology VIA photo alignment through TiN hard mask removing above previous photo alignment mark area
2008 · Wen-Shiang Liao, Hsin-Hung Lin, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
An ultra-narrow FinFET poly-Si gate structure fabricated with 193nm photolithography and in-situ PR/BARC and TEOS hard mask etching
2008 · Wen-Shiang Liao, Cheng-Han Wu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Systematic Analysis and Modeling of On-Chip Spiral Inductors for CMOS RFIC Application
2007 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Impacts of Layout Dimensions and Ambient Temperatures on Silicon Based On-Chip RF
2007 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications
2007 · Mao-Chyuan Tang, Yean-Kuen Fang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Non-destructive extraction of width bias variations for deep sub-micron interconnect lines
2007 · Mao-Chyuan Tang, Meng-Feng Wang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Impacts of Layout Dimensions and Ambient Temperatures on Silicon Based On-Chip RF Interconnects
2006 · Mao-Chyuan Tang, Fang Yean-Kuen, et al.
Works count: 17
Citation count: 91
H-index: 4
I10-index: 3
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