Get started
Author

Elena Mengotti

Observed names: E. Mengotti, Mengotti, Elena
Institution: ABB (Switzerland)
ORCID: 0009-0005-4665-408X
Observed ORCID: 0009-0005-4665-408X
OpenAlex ID: A5106733682
Acoustic Emission in Power Semiconductor Modules—First Observations
2014 · Tommi J. Karkkainen, Joonas P. Talvitie, et al. · IEEE Transactions on Power Electronics · 69
Acoustic emission caused by the failure of a power transistor
2015 · Tommi J. Karkkainen, Joonas P. Talvitie, et al. · Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition · 22
Sounds from semiconductors - Acoustic emission experiment with a power module
2014 · Tommi J. Karkkainen, Joonas P. Talvitie, et al. · European Conference on Power Electronics and Applications · 19
Eliminating infant mortality in metallized film capacitors by defect detection
2014 · F.P. McCluskey, N.M. Li, et al. · Microelectronics Reliability · 18
Performance Evaluation of the Body-Diode of SiC Mosfets under Repetitive Surge Current Operation
2019 · Thiago Batista Soeiro, Elena Mengotti, et al. · Annual Conference of the IEEE Industrial Electronics Society (IECON) · 15
High Humidity, High Temperature and High Voltage Reverse Bias - A Relevant Test for Industrial Applications
2018 · Joni Jormanainen, Elena Mengotti, et al. · 15
Physics-of-failure assessment methodology for power electronic systems
2014 · D. Squiller, H. Greve, et al. · Microelectronics Reliability · 15
Vertical Power SiC MOSFETs with High-k Gate Dielectrics and Superior Threshold Voltage Stability
2020 · Stephan Wirths, Yulieth Arango, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 14
Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages
2022 · I. Kovacevic-Badstuebner, S. Race, et al. · IEEE International Reliability Physics Symposium proceedings · 13
Fretting corrosion: Analysis of the failure mechanism for low voltage drives applications
2014 · E. Mengotti, L.I. Duarte, et al. · Microelectronics Reliability · 12
Comparative Study on Power Cycling Capabilities of SiC Power MOSFET and Si IGBT Baseplate-Less Power Modules
2024 · Ivana Kovacevic-Badstuebner, Elena Mengotti, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 9
Study of moisture transport in silicone gel for IGBT modules
2020 · K. Zhang, G. Schlottig, et al. · Microelectronics Reliability · 9
Thermal Analysis of SiC Power Semiconductor Packages using the Structure Function
2021 · Salvatore Race, Ivana Kovacevic-Badstuebner, et al. · International Workshop on Thermal Investigations of ICs and Systems · 8
Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs
2023 · Ivana Kovacevic-Badstuebner, Salvatore Race, et al. · IEEE International Reliability Physics Symposium proceedings · 7
Measurement challenges in acoustic emission research of semiconductors
2015 · Tommi J. Karkkainen, Joonas P. Talvitie, et al. · European Conference on Power Electronics and Applications · 7
Temperature Dependent Transient Threshold Voltage Hysteresis in SiC Power MOSFETs and Implications for Short Circuit Events
2021 · E. Mengotti, E. Bianda, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 6
Industrial approach to the chip and package reliability of SiC MOSFETs (Invited)
2023 · Elena Mengotti, Enea Bianda, et al. · IEEE International Reliability Physics Symposium proceedings · 5
Power Cycling of Sintered SiC Power MOSFET Baseplate-less Modules with Aluminum Oxide and Silicon Nitride Substrates
2023 · Ivana Kovacevic-Badstuebner, Elena Mengotti, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 4
High Temperature Gate Voltage Step-by-Step Test to Assess Reliability Differences in 1200 V SiC MOSFETs
2020 · Elena Mengotti, Enea Bianda, et al. · Materials science forum · 4
Threshold Voltage Stability Study on Power SiC MOSFETs Using High-k Dielectrics
2020 · Stephan Wirths, Elena Mengotti, et al. · PCIM Europe digital days 2020; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management · 2
Assessing solder interconnect reliability of control boards in power electronic systems using Physics-of-Failure models
2014 · David Squiller, Elena Mengotti, et al. · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · 2
Experimental Comparative Analysis of PCB Cooling Technologies Including Nonlinear Thermal Effects
2025 · Denis Musella, Elena Mengotti, et al. · International Workshop on Thermal Investigations of ICs and Systems · 1
Threshold Voltage Stability of 1200 V SiC MOSFETs
2020 · Oriol López Sánchez, Elena Mengotti, et al. · ARCA (Università Ca' Foscari Venezia) · 1
Towards Time-Resolved X-UV Digital in-line Holography
2006 · Elena Mengotti, Guillaume Genoud · Lund University Publications Student Papers (Lund University) · 1
PDF
Investigation of Packaging Solutions for SiC MOSFET Baseplateless Modules
2025 · Elena Mengotti, Ivana Kovacevic-Badstuebner, et al. · IEEE Transactions on Power Electronics
Works count: 30
Citation count: 278
H-index: 10
I10-index: 10
Year
Topic
Type