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Ting-Pu Tai
Institution:
Synopsys (United States)
Observed institutions:
Synopsys (United States),
Mentor Graphics (United States)
OpenAlex ID:
A5109610004
Faster defect localization in nanometer technology based on defective cell diagnosis
2007
·
Manish Sharma
, Wu-Tung Cheng
, et al.
·
IEEE International Test Conference (ITC)
·
40
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data
2008
·
M. Sharma
, B. Benware
, et al.
·
IEEE International Test Conference (ITC)
·
35
Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns
2009
·
Yu Huang
, Wu-Tung Cheng
, et al.
·
Proceedings - Asian Test Symposium/Proceedings
·
33
Experiences with Layout-Aware Diagnosis—A Case Study
2010
·
Yi-Jung Chang
, Man-Ting Pang
, et al.
·
EDFA Technical Articles
·
20
Diagnosis and Layout Aware (DLA) Scan Chain Stitching
2014
·
Jing Ye
, Yu Huang
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
·
18
Diagnosing timing related cell internal defects for FinFET technology
2015
·
Huaxing Tang
, Ting-Pu Tai
, et al.
·
International Symposium on VLSI Design, Automation and Test
·
13
Layout-Aware Diagnosis Leads to Efficient and Effective Physical Failure Analysis
2011
·
Manish Sharma
, Sergej Schwarz
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
13
Automotive semiconductor test
2017
·
Steve Pateras
, Ting-Pu Tai
·
International Symposium on VLSI Design, Automation and Test
·
12
Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs
2022
·
Khader Abdel-Hafez
, Michael Dsouza
, et al.
·
IEEE International Test Conference (ITC)
·
9
Test cycle power optimization for scan-based designs
2010
·
Kun-Han Tsai
, Yu Huang
, et al.
·
IEEE International Test Conference (ITC)
·
9
Improving Silicon Health and Operational Metrics at Each Phase of the Device Lifecycle
2023
·
Ting-Pu Tai
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
3
Diagnosis and Layout Aware (DLA) scan chain stitching
2013
·
Jing Ye
, Yu Huang
, et al.
·
IEEE International Test Conference (ITC)
·
3
Enabling Baseline Yield Improvement with Diagnosis Driven Yield Analysis
2012
·
Wu Yang
, Ting-Pu Tai
, et al.
·
ECS Transactions
·
3
Diagnose Compound Hold Time Faults Caused by Spot Delay Defects at Clock Tree
2011
·
Yu Huang
, Wu-Tung Cheng
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
2
Case study of reducing excursion yield loss
2015
·
Ting-Pu Tai
·
China Semiconductor Technology International Conference (CSTIC)
Case study of scan chain diagnosis and PFA on a low yield wafer
2010
·
Yu Huang
, Brady Benware
, et al.
·
IEEE International Test Conference (ITC)
Customized Algorithms for High Performance Memory Test in Advanced Technology Node
2009
·
Shomo Chen
, Ning Huang
, et al.
·
Proceedings - Asian Test Symposium/Proceedings
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Works count:
17
Citation count:
213
H-index:
9
I10-index:
8
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