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A. Reader
Observed names:
A Reader,
A. READER,
Alec Reader
Observed institutions:
Philips (Netherlands),
Philips (France),
Dublin City University,
University of Southampton
OpenAlex ID:
A5109945514
Room-temperature ultraviolet luminescence from γ-CuCl grown on near lattice-matched silicon
2005
·
L. O’Reilly
, O. F. Lucas
, et al.
·
Journal of Applied Physics
·
36
PDF
Growth of Selective Tungsten on Self‐Aligned Ti and PtNi Silicides by Low Pressure Chemical Vapor Deposition
1986
·
E. K. Broadbent
, A. E. Morgan
, et al.
·
Journal of The Electrochemical Society
·
29
Growth and characterisation of wide-bandgap, I-VII optoelectronic materials on silicon
2005
·
L. O’Reilly
, G. Natarajan
, et al.
·
Journal of Materials Science Materials in Electronics
·
26
Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping
2005
·
L. O’Reilly
, A. Mitra
, et al.
·
Journal of Crystal Growth
·
23
Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, electrical data and raman spectroscopy
1999
·
P. J. Mcnally
, J. W. Curley
, et al.
·
Journal of Materials Science Materials in Electronics
·
15
Optical properties of CuCl films on silicon substrates
2008
·
Anirban Mitra
, L. O'Reilly
, et al.
·
physica status solidi (b)
·
10
Nanotechnology and its application to medical hygiene textiles
2011
·
F.S. Artain
, A. Reader
, et al.
·
Elsevier eBooks
·
4
The quality of 200 mm diameter epitaxial Si wafers for advanced CMOS technology monitored using synchrotron X-ray topography
1999
·
Patrick J. McNally
, A.N. Danilewsky
, et al.
·
Microelectronic Engineering
·
4
The use of wide-bandgap CuCl on silicon for ultra-violet photonics
2005
·
L. O'Reilly
, G. Natarajan
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Optical testing techniques for new semiconductor processes and new materials
2001
·
A. Reader
, C. Moore
, et al.
·
Surface and Interface Analysis
·
3
Micro-Raman Spectroscopy Evaluation of the Local Mechanical Stress in Shallow Trench Isolation CMOS Structures: Correlation with Defect Generation and Diode Leakage
1998
·
I. De Wolf
, G. Groeseneken
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
2
Structural and optoelectronic properties of sputtered copper (I) chloride
2005
·
Gomathi Natarajan
, Lisa O'Reilly
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
PDF
An Examination of the Crystalline Quality of 200mm Diameter Silicon Substrates using X-ray Topography
1997
·
J. Curley
, P. J. McNally
, et al.
·
MRS Proceedings
·
1
Contributor contact details
2011
·
Brian J. McCarthy
, Manjeet Jassal
, et al.
·
Elsevier eBooks
Room-temperature ultraviolet luminescence from ƴ-CuCl grown on near lattice-matched silicon
2005
·
L. O’Reilly
, Francis Olabanji Lucas
, et al.
·
Dublin City University Open Access Institutional Repository (Dublin City University)
PDF
Preventing production problems on gearing up
2002
·
Alec Reader
, John Hennessy
·
III-Vs Review
European 300 mm metrology platform — MEDEA T618
2001
·
J Trilhe
, A Reader
, et al.
·
Microelectronic Engineering
ChemInform Abstract: Growth of Selective Tungsten on Self‐Aligned Ti and PtNi Silicides by Low Pressure Chemical Vapor Deposition.
1986
·
E. K. BROADBENT
, A. E. MORGAN
, et al.
·
ChemInform
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Works count:
18
Citation count:
157
H-index:
6
I10-index:
6
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