Author

Mikio Yamamuka

Observed names: M Yamamuka, M. Yamamuka, Mikio Yamamuka Mikio Yamamuka, Yamamuka Mikio
OpenAlex ID: A5111644643
2017 · Tatsuro Watahiki, Yohei Yuda, et al. · Applied Physics Letters · 231
2019 · Chia-Hung Lin, Yohei Yuda, et al. · IEEE Electron Device Letters · 212
1994 · Takaaki Kawahara, Mikio Yamamuka, et al. · Japanese Journal of Applied Physics · 101
1996 · Takaaki Kawahara, Mikio Yamamuka, et al. · Japanese Journal of Applied Physics · 94
2017 · Tetsuro Hayashida, Takuma Nanjo, et al. · Applied Physics Express · 72
1996 · Mikio Yamamuka, Takaaki Kawahara, et al. · Japanese Journal of Applied Physics · 44
1994 · Takaaki Kawahara, Mikio Yamamuka, et al. · Japanese Journal of Applied Physics · 38
2002 · A. Yuuki, M. Yamamuka, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 33
2016 · Tatsuro Watahiki, Yumiko Kobayashi, et al. · Journal of Applied Physics · 25
2018 · Tetsuro Hayashida, Takuma Nanjo, et al. · Japanese Journal of Applied Physics · 23
1999 · Mikio Yamamuka, Takaaki Kawahara, et al. · Journal of Applied Physics · 23
1999 · Takaaki Kawahara, Shigeru Matsuno, et al. · Japanese Journal of Applied Physics · 22
1996 · Mikio Yamamuka, Takaaki Kawahara, et al. · Japanese Journal of Applied Physics · 19
1997 · Mikio Yamamuka, Takaaki Kawahara, et al. · Japanese Journal of Applied Physics · 18
2002 · Masayoshi Tarutani, Mikio Yamamuka, et al. · Thin Solid Films · 11
1993 · Tatsuru Shirafuji, Wei-ming Chen, et al. · Japanese Journal of Applied Physics · 11
2016 · Shinya Nishimura, Tatsuro Watahiki, et al. · IEEE Journal of Photovoltaics · 10
1998 · Tsuyoshi Horikawa, Masayoshi Tarutani, et al. · MRS Proceedings · 10
1997 · Takaaki Kawahara, Mikio Yamamuka, et al. · Japanese Journal of Applied Physics · 9
2020 · Daisuke Fujisawa, Misaki Hanaoka, et al. · SPIE Infrared Technology and Applications · 7
2002 · Mikio Yamamuka, Shun Momose, et al. · Japanese Journal of Applied Physics · 7
1994 · T. Kawahara, M. Yamamuka, et al. · MRS Proceedings · 6
2002 · T. Horikawa, T. Kawahara, et al. · IEEE International Reliability Physics Symposium proceedings · 5
Works count: 54
Citation count: 1,136
H-index: 15
I10-index: 19
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