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Sitian Gao

Observed names: Gao Si-Tian, S Gao, Si-Tian Gao, Si-tian Gao, sitian Gao
OpenAlex ID: A5112038001
Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)
2016 · Yaxuan Yao, Lingling Ren, et al. · Journal of Material Science and Technology · 90
An atomic force microscope head designed for nanometrology
2007 · Mingzhen Lu, Sitian Gao, et al. · Measurement Science and Technology · 18
A CD probe with a tailored cantilever for 3D-AFM measurement
2018 · Rui Zhang, Sen Wu, et al. · Measurement Science and Technology · 15
Adaptive-angle scanning method for 3D measurement with atomic force microscopy
2019 · Rui Zhang, Sen Wu, et al. · Measurement Science and Technology · 12
Precise measurement of gold nanorods by using depolarized dynamic light scattering apparatus
2021 · Zhen Cui, Lu Huang, et al. · Optoelectronics Letters · 8
Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling
2018 · Yushu Shi, Wei Li, et al. · Ultramicroscopy · 8
Microwave-induced combustion of graphene for further determination of elemental impurities using ICP-OES and TXRF
2018 · Airui Zhang, Hai Wang, et al. · Journal of Analytical Atomic Spectrometry · 8
Angle comparison using an autocollimator
2018 · Ralf D Geckeler, Andreas Just, et al. · Metrologia · 7
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Precise measurement of particle size in colloid system based on the development of multiple-angle dynamic light scattering apparatus
2020 · Lu Huang, Miao Sun, et al. · Applied Physics B · 6
Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrology
2020 · Zhiyue Zheng, Sitian Gao, et al. · Ultramicroscopy · 6
Total reflection X-ray fluorescence as a convenient tool for determination of trace elements in microscale gasoline and diesel
2018 · Airui Zhang, Axiang Jin, et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 6
Final report on APMP regional key comparison APMP.L-K6: Calibration of ball plate and hole plate
2014 · Toshiyuki Takatsuji, Taebong Eom, et al. · Metrologia · 6
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Calibration method of curvature distortion in step height measurement by atomic force microscopy
2020 · Wei Li, Xixi Yu, et al. · IOP Conference Series Materials Science and Engineering · 5
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Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy
2014 · Yuhang Chen, Tingting Luo, et al. · Microscopy and Microanalysis · 4
Nanometer film thickness metrology and traceability based on grazing incidence X-ray reflectometry
2014 · Cui Jian-Jun, Gao Si-Tian · Acta Physica Sinica · 4
Metrological atomic force microscope and traceable measurement of nano-dimension structures
2013 · Sitian Gao, Mingzhen Lu, et al. · ACTA IMEKO · 3
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APMP.L-K1: Calibration of gauge blocks by interferometry: Final Report
2006 · Ichiro Fujima, Akiko Hirai, et al. · Metrologia · 3
Simulation and signal analysis of Akiyama probe applied to atomic force microscope
2013 · Longlong Wang, Mingzhen Lu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Error analysis of homodyne multi-pass interferometer with Jones matrix
2013 · Wei Li, Sitian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Characterization of Akiyama probe applied to dual-probes atomic force microscope
2016 · Hequn Wang, Sitian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Control and measuring system of a two-dimensional scanning nanopositioning stage based on LabVIEW
2015 · Rui-Jun Zhang, Si-Tian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Critical dimensional linewidth calibration using UV microscope and laser interferometry
2013 · Qi Li, Si-tian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Dual AFM probes alignment based on vision guidance
2013 · Hua-kun Zhang, Si-tian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Long range metrological atomic force microscope with versatile measuring head
2013 · Mingzhen Lu, Sitian Gao, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Report on EURAMET supplementary comparison measurement of steel tapes of 10 m and 50 m
2025 · F Pollinger, M Wedde, et al. · Metrologia
Works count: 44
Citation count: 218
H-index: 7
I10-index: 4
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