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Kris Dickson
Observed names:
K DICKSON,
K. Dickson
Institution:
NXP (United States)
Observed institutions:
Tufts University,
Motorola (United States),
NXP (Germany),
NXP (United States)
OpenAlex ID:
A5112596163
Defect Localization Using Time-Resolved Photon Emission on SOI Devices that Fail Scan Tests
2002
·
Dan Bodoh
, Ed Black
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
18
Some lessons learned from research on a thin film electrochromic window
1994
·
R GOLDNER
, F ARNTZ
, et al.
·
Solid State Ionics
·
18
Electron Beam Absorbed Current as a means of locating metal defectivity on 45nm SOI technology
2011
·
K. Dickson
, G. Lange
, et al.
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
8
Electron Beam Absorbed Current as a Means of Locating Metal Defectivity on 45nm SOI Technology
2010
·
K. Dickson
, G. Lange
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
8
Root Cause Analysis Techniques Using Picosecond Time Resolved LADA
2014
·
Dan Bodoh
, Kent Erington
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
5
The Role of Free Carrier Absorption in LADA
2014
·
Kent Erington
, Dan Bodoh
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
4
Picosecond Time-Resolved LADA Integrated with a Solid Immersion Lens on a Laser Scanning Microscope
2017
·
Kris Dickson
, Kent Erington
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
3
Advanced Backside Defect Isolation Techniques Using Electron Beam Absorbed Current to Locate Metal Defectivity on Bulk and SOI Technology
2011
·
K. Erington
, K. Dickson
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
3
Localization of Subtle Front-End FinFET Defects Using EBIC
2024
·
Nick Pronin
, Khiem Ly
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
2
On Demand Bit-Level SRAM Validation using CW 785nm Laser-Induced Fault Analysis (LIFA)
2023
·
Keith A. Serrels
, Kris Dickson
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
1
Scan Chain Fault Isolation using Single Event Upsets Induced by a Picosecond 1064nm Laser
2018
·
Keith A. Serrels
, Kris Dickson
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
1
Case Study of a DDR Loopback Test Failure Encountered on a Map Ball Grid Array Packaged Device
2017
·
Jose Z. Garcia
, Kris Dickson
·
Proceedings - International Symposium for Testing and Failure Analysis
·
1
Nanoprobing of Advanced Silicon-On-Insulator Transistors
2019
·
Stefano Larentis
, Kent Erington
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Analysis of an Asynchronously Generated Race Condition
2016
·
Clifford Howard
, Kris Dickson
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
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Works count:
14
Citation count:
72
H-index:
5
I10-index:
2
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