Author

Gordon Dallas

Observed names: G Dallas, G. Dallas

OpenAlex ID: A5113935218

Gas-cluster ion-beam smoothing of chemo-mechanical-polish processed GaSb(100) substrates

2003 · L. P. Allen, T. G. Tetreault, et al. · Journal of Electronic Materials · 12

GaSb substrates with extended IR wavelength for advanced space-based applications

2009 · L. P. Allen, P. Flint, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11

Manufacturing of 100mm diameter GaSb substrates for advanced space based applications

2011 · L. P. Allen, J. P. Flint, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8

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Growth and characterization of 6" InSb substrates for use in large area infrared imaging applications

2013 · Mark J. Furlong, Gordon Dallas, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

100mm diameter GaSb substrates with extended IR wavelength for advanced space-based applications

2011 · L. P. Allen, J. P. Flint, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6

Molecular beam epitaxy on gas cluster ion beam-prepared GaSb substrates: Towards improved surfaces and interfaces

2008 · Kannan Krishnaswami, Shivashankar R. Vangala, et al. · Journal of Crystal Growth · 6

100mm GaSb substrate manufacturing for IRFPA epi growth

2012 · Lisa P. Allen, J. Patrick Flint, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Molecular beam epitaxy and morphological studies of homoepitaxial layers on chemical mechanical polished InSb(100) and InSb(111)B substrates

2006 · S. R. Vangala, X. Qian, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5

Epitaxial growth on gas cluster ion-beam processed GaSb substrates using molecular-beam epitaxy

2004 · K. Krishnaswami, S. R. Vangala, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5

Towards the production of very low defect GaSb and InSb substrates: bulk crystal growth, defect analysis and scaling challenges

2013 · R. Martinez, S. Amirhaghi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

Standardizing large format 5" GaSb and InSb substrate production

2017 · Becky Martinez, J. Patrick Flint, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

CMP process comparison for 150mm larger area InSb (111)B focal plane array substrates

2009 · P. Flint, L. P. Allen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Production manufacturing of 5" diameter gallium antimonide substrates (Conference Presentation)

2017 · James P. Flint, Gordon Dallas, et al. · 1

Growth and characterization of 6" InSb substrates for use in large-area infrared-imaging applications

2014 · Mark J. Furlong, Gordon Dallas, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Successful MWIR FPA fabrication using gas cluster ion-beam InSb surface finishing

2007 · L. P. Allen, G. Dallas, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

化学機械研磨InSb(100)及びInSb(111)B基板上のホモエピタキシャル層の分子ビームエピタクシー及び形態学的研究 | 文献情報 | J-GLOBAL 科学技術総合リンクセンター

2006 · S R Vangala, X Qian, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Roughness Analysis of Episurfaces Grown on Ion-Beam Processed GaSb Substrates

2004 · K. Krishnaswami, D. B. Fenner, et al. · MRS Proceedings

Works count: 17

Citation count: 76

H-index: 6

I10-index: 2