Work

Defect-Oriented Analog Testing

Year: 2007

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/0-387-46547-2_6

Authors: Manoj Sachdev, José Pineda de Gyvez

Institutions: University of Waterloo, Eindhoven University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1513194039

FWCI:

Cites: 60

Cited by: 1

Related to: 10