Metrology and methodology of system level ESD testing
Year: 2002
Type: conference-paper
Authors: D. Lin, D. Pommerenke, J. Barth, L.G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1571226483