Work

HBM tester parasitic effects on high pin count devices with multiple power and ground pins

Year: 2006

Type: conference-paper

Source: Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)

Authors: Chaine, Meuse, Ashton, Henry, Natarajan, Barth, Adeline Su Yien Ting, Gieser, Voldman, Farris, Grund, Ward, Kelly, Narayan, Johnson, Gaertner, Peachey

Institutions: Micron (United States), International Medical Equipment Collaborative, Texas Instruments (United States), Fraunhofer USA, IBM (United States), Intel (United States), Cypress Semiconductor Corporation (United States), Infineon Technologies (Germany)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1581389818

FWCI: 2.11

Cites: 3

Cited by: 7

Related to: 10