Work

Test vector encoding using partial LFSR reseeding

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2001.966711

Authors: C.V. Krishna, A. Jas, N.A. Touba

Institution: The University of Texas at Austin

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1582825744

FWCI: 15.05

Cites: 14

Cited by: 223

Related to: 10