Scan vector compression/decompression using statistical coding
Year: 2003
Type: conference-paper
Source: IEEE VLSI Test Symposium (VTS)
Authors: A. Jas, J. Ghosh-Dastidar, N.A. Touba
Institution: The University of Texas at Austin
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W1908802429