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Gratings of regular arrays and trim exposures for ultralarge scale integrated circuit phase-shift lithography

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Year: 2001
Type: article
Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
DOI: 10.1116/1.1408950
Authors: M. Fritze, B. Tyrrell, D. Astolfi, D. Yost, P. Davis, B. Wheeler, R. Mallen, J. Jarmolowicz, S. Cann, D. Chan, P. Rhyins, C. Carney, J. Ferri, B. A. Blachowicz
Institutions: MIT Lincoln Laboratory, Massachusetts Institute of Technology
Language: English

Topic: Advancements in Photolithography Techniques
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Defense, Defense Advanced Research Projects Agency
OpenAlex ID: W2083224486
FWCI: 1.255
Cites: 12
Cited by: 11
Related to: 10
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