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Bruce Wheeler

Observed names: B. D. Wheeler, B. Wheeler, B.D. Wheeler, Bruce D. Wheeler
OpenAlex ID: A5111635588
Megapixel CMOS image sensor fabricated in three-dimensional integrated circuit technology
2005 · V. Suntharalingam, R. Berger, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 123
High-Speed Schottky-Barrier pMOSFET With $f_T = 280 hbox GHz$
2004 · M. Fritze, C.L. Chen, et al. · IEEE Electron Device Letters · 99
Wafer-scale 3D integration of InGaAs image sensors with Si readout circuits
2009 · C.L. Chen, D-R. Yost, et al. · IEEE International Conference on 3D System Integration (3DIC) · 27
Subwavelength Optical Lithography with Phase-Shift Photomasks
2003 · M. Fritze, Brian Tyrrell, et al. · 20
Three-dimensional integration of silicon-on-insulator RF amplifier
2008 · C.L. Chen, C.K. Chen, et al. · Electronics Letters · 12
Wafer-scale 3D integration of InGaAs photodiode arrays with Si readout circuits by oxide bonding and through-oxide vias
2010 · C.L. Chen, D.-R. Yost, et al. · Microelectronic Engineering · 11
Gratings of regular arrays and trim exposures for ultralarge scale integrated circuit phase-shift lithography
2001 · M. Fritze, B. Tyrrell, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 11
100-nm node lithography with KrF?
2001 · Michael Fritze, Brian Tyrrell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 11
Wafer-Scale 3D Integration of Silicon-on-Insulator RF Amplifiers
2009 · C. L. Chen, C. K. Chen, et al. · IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) · 10
Dense only phase-shift template lithography
2003 · Michael Fritze, Brian Tyrrell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
SOI-enabled three-dimensional integrated-circuit technology
2010 · C.K. Chen, B. Wheeler, et al. · IEEE International SOI Conference (SOI) · 8
Investigation of the physical and practical limits of dense-only phase shift lithography for circuit feature definition
2002 · Brian Tyrrell, Michael Fritze, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 8
Three-Dimensional Integration Technology for Advanced Focal Planes
2008 · Craig Lewis Keast, Brian Aull, et al. · MRS Proceedings · 6
Investigation of the physical and practical limits of dense-only phase-shift lithography for circuit feature definition
2002 · Brian Tyrrell, Michael Fritze, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
Optical imaging properties of dense phase shift feature patterns
2002 · M. Fritze, B. Tyrrell, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5
Limits of strong phase-shift patterning for device research
2003 · Michael Fritze, Renee D. Mallen, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
3D-enabled heterogeneous integrated circuits
2013 · C.K. Chen, D.R.W. Yost, et al. · IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference · 2
Lincoln Laboratory's 3D Circuit Integration Technology
2008 · James Burns, Brian Aull, et al. · 2
Multiproject Circuit Design and Layout in Lincoln Laboratory's 3D Technology
2008 · James Burns, Robert Berger, et al.
Integration of high-speed surface-channel charge coupled devices into an SOI CMOS process using strong phase shift lithography
2008 · Jeffrey Knecht, Vladimir Bolkhovsky, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
An SOI-Based 3D Circuit Integration Technology
2008 · James Burns, Brian Aull, et al. · Integrated circuits and systems
Investigation of full-field CD control of sub-100-nm gate features by phase-shift 248-nm lithography
2001 · Michael Fritze, Brian Tyrrell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 26
Citation count: 374
H-index: 10
I10-index: 10
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