Work

An efficient test vector compression scheme using selective huffman coding

Year: 2003

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2003.811452

Authors: A. Jas, J. Ghosh-Dastidar, Mom-Eng Ng, N.A. Touba

Institutions: Intel (United States), Altera (United States), Advanced Micro Devices (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2105028194

FWCI: 18.56

Cites: 38

Cited by: 270

Related to: 10