Work

Probability analysis for CMOS floating gate faults

Year: 2002

Type: conference-paper

Source: European Design and Test Conference

DOI: 10.1109/edtc.1994.326838

Authors: H. Xue, C. Di, J.A.G. Jess

Institution: Eindhoven University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2539235335

FWCI: 3.01

Cites: 19

Cited by: 47

Related to: 10