Work

Impact on device performance and monitoring of a low dose of tungsten contamination by Dark Current Spectroscopy

Year: 2010

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2010.5488821

Authors: F. Domengie, J. L. Regolini, D. Bauza, P. Morin

Institutions: STMicroelectronics (France), Institut de Microélectronique, Electromagnétisme et Photonique, Centre de Radiofréquences, Optique et Micro-nanoélectronique des Alpes

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1994209179

FWCI: 0.856

Cites: 20

Cited by: 25

Related to: 10