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Manfred Maul
Observed names:
M Maul,
M. Maul
Institution:
Carl Zeiss (Germany)
Observed institutions:
Carl Zeiss (Germany),
Friedrich-Alexander-Universität Erlangen-Nürnberg
OpenAlex ID:
A5010767289
Triangulation With Expanded Range Of Depth
1985
·
G. Bickel
, G. Hausler
, et al.
·
Optical Engineering
·
125
Experimental result and simulation analysis for the use of pixelated illumination from source mask optimization for 22nm logic lithography process
2009
·
Kafai Lai
, Alan E. Rosenbluth
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
47
Generation of arbitrary freeform source shapes using advanced illumination systems in high-NA immersion scanners
2010
·
Jörg Zimmermann
, Paul Gräupner
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
28
Optimizing and enhancing optical systems to meet the low k 1 challenge
2003
·
Donis G. Flagello
, Robert J. Socha
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
24
Range sensing based on shearing interferometry
1988
·
Gerd Häusler
, J. Hutfless
, et al.
·
Applied Optics
·
23
Triangulation With Large Dynamical Range
1986
·
W Dremel
, G Hausler
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
20
Speckle in optical lithography and its influence on linewidth roughness
2009
·
Oscar Noordman
, Andrey Tychkov
, et al.
·
Journal of Micro/Nanopatterning Materials and Metrology
·
19
Telecentric Scanner For 3-D Sensing
1985
·
G. Hausler
, M. Maul
·
Optical Engineering
·
14
Speckle in optical lithography and the influence on line width roughness
2009
·
Oscar Noordman
, Andrey Tychkov
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
8
Triangulation With Expanded Range Of Depth
1986
·
G Hausler
, M Maul
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
Triangulation with expanded range of depth
1985
·
G. Häusler
, M. Maul
·
Annual Meeting Optical Society of America
·
2
Three-Dimensional Inspection of Large Objects
1987
·
G. Bickel
, G. Häusler
, et al.
·
Springer eBooks
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Works count:
12
Citation count:
313
H-index:
8
I10-index:
8
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