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Oriol Aviñó-Salvadó

Observed names: Avino-Salvado, Oriol, Aviño Salvado, Oriol, Aviñó Salvadó, Oriol, Aviñó, Oriol, Aviñó-Salvadó, Oriol, O. Avino, O. Avino-Salvado, O. Aviñó, Oriol Avino, Oriol Avino Salvado, Oriol Avino-Salvado, Oriol Aviño-Salvado, Oriol Aviñó, Oriol Aviñó Salvadó, Salvado, Oriol, Aviño
Observed institutions: Lyon 1 Université, Centre National de la Recherche Scientifique, Consejo Superior de Investigaciones Científicas, Université de Lyon, Laboratoire Ampère, Centro Nacional de Microelectrónica, Institut de Microelectrònica de Barcelona, Safran (France), Institut National des Sciences Appliquées de Lyon, Universitat Rovira i Virgili
ORCID: 0000-0003-3099-3827
Observed ORCID: 0000-0003-3099-3827
OpenAlex ID: A5014116339
Simplified Mathematical Model for Calculating the Oxygen Excess Ratio of a PEM Fuel Cell System in Real-Time Applications
2013 · Carlos Restrepo, Tine Konjedic, et al. · IEEE Transactions on Industrial Electronics · 39
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Power Losses and Current Distribution Studies by Infrared Thermal Imaging in Soft- and Hard-Switched IGBTs Under Resonant Load
2019 · Manuel Fernandez, Xavier Perpina, et al. · IEEE Transactions on Power Electronics · 24
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate
2019 · Besar Asllani, Alberto Castellazzi, et al. · IEEE International Reliability Physics Symposium proceedings · 21
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Extraction of the 4H-SiC/SiO 2 Barrier Height Over Temperature
2019 · O. Avino-Salvado, B. Asllani, et al. · IEEE Transactions on Electron Devices · 20
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Humidity sensitivity of large area silicon sensors: Study and implications
2020 · J. Fernández-Tejero, P.P. Allport, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 19
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Statistical Study of Nanocrystalline Alloy Cut Cores From Two Different Manufacturers
2014 · Fabien Sixdenier, Julien Morand, et al. · IEEE Transactions on Magnetics · 18
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs
2023 · Oriol Aviñó-Salvadó, Cyril Buttay, et al. · IEEE Transactions on Industrial Electronics · 17
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SiC MOSFETs robustness for diode-less applications
2018 · O. Avino-Salvado, C. Cheng, et al. · EPE Journal · 17
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Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling
2017 · Wissam Sabbah, Faical Arabi, et al. · Microelectronics Reliability · 17
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Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
2018 · Oriol Aviñó Salvadó, Hervé Morel, et al. · Microelectronics Reliability · 16
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High temperature ageing of microelectronics assemblies with SAC solder joints
2017 · Wissam Sabbah, Pierre Bondue, et al. · Microelectronics Reliability · 14
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Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics
2023 · Conrad Ferrer, Oriol Aviñó, et al. · IEEE Transactions on Instrumentation and Measurement · 13
Design of a Low-Capacitance Planar Transformer for a 4 kW/500 kHz DAB Converter
2019 · Pierre Demumieux, Oriol Avino-Salvado, et al. · Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition · 13
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Carrier Concentration Analysis in 1.2 kV SiC Schottky Diodes Under Current Crowding
2022 · F. Bonet, O. Avino-Salvado, et al. · IEEE Electron Device Letters · 8
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Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits
2020 · Miquel Vellvehi, Xavier Perpina, et al. · IEEE Transactions on Industrial Electronics · 8
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Evaluation of Printed-Circuit Board Materials for High-Temperature Operation
2017 · Oriol Aviño-Salvado, Wissam Sabbah, et al. · Journal of Microelectronics and Electronic Packaging · 6
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Determination of Anand viscoplastic constitutive parameters for the AuGe solder alloy from experimental stress-strain curves for power systems integration FEA simulations
2021 · Naum Fuste, Oriol Avino, et al. · Smart Systems Integration Conference and Exhibition (SSI) · 4
Simulation-Based Analysis of Thermo-Mechanical Constraints in Packages for Diamond Power Devices
2020 · N. Fuste, O. Avino, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 4
Contribution to the study of the SiC MOSFETs gate oxide
2018 · Oriol Aviñó Salvadó · theses.fr (ABES) · 4
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Analysis of SiC Schottky diodes after thermal vacuum test by means of lock-in infrared thermography
2020 · M. Vellvehi, X. Perpina, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 3
Reactivation System for Proton-Exchange Membrane Fuel-Cells
2012 · Carlos Restrepo, Oriol Avino, et al. · Energies · 3
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Evaluation of printed-circuit boards materials for high temperature operation
2017 · Oriol Aviño-Salvado, Wissam Sabbah, et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) · 2
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Measurement Uncertainty in Fourier Coefficient- Based Time Series Reconstruction Considering Calibration Effects in Thermal Imaging
2024 · Roger Solé, Conrad Ferrer, et al. · IEEE Transactions on Instrumentation and Measurement · 1
Thermo-Mechanical Constraints for Packaging of Diamond Components
2022 · Naum Fuste, Emma Sola, et al. · IEEE International Workshop on Integrated Power Packaging (IWIPP) · 1
Measurement of Free-Carrier Density in a 1.2 kV SiC Schottky Diode Under Overstress Conditions
2025 · Ferran Bonet, Oriol Aviñó, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs
Works count: 38
Citation count: 292
H-index: 13
I10-index: 13
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