Author

Allan L. Sagle

1987 · M. Haji-Saied, E. Bleszynski, et al. · Physical Review C · 52
1982 · A. Shor, K. Ganezer, et al. · Physical Review Letters · 46
1977 · J. V. Geaga, M. M. Gazzaly, et al. · Physical Review Letters · 29
2000 · M. Mankos, S. Coyle, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 27
1986 · A. Stetz, L.W. Swenson, et al. · Nuclear Physics A · 27
1981 · A. Stetz, L. W. Swenson, et al. · Physical Review Letters · 24
1979 · G. Igo, M. Bleszynski, et al. · Physical Review Letters · 20
1974 · M.W. McNaughton, F.P. Brady, et al. · Nuclear Instruments and Methods · 19
1979 · M. Bleszynski, J. Carroll, et al. · Physics Letters B · 18
1975 · A.L. Sagle, M.W. McNaughton, et al. · Nuclear Instruments and Methods · 16
2001 · M. Mankos, S. Coyle, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 12
2002 · S. T. Coyle, D. Holmgren, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 10
1985 · T. Hallman, J. Carroll, et al. · Nuclear Physics A · 9
2005 · Ming L. Yu, Allan Sagle, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2001 · M. Mankos, A. Sagle, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 8
2011 · Glen Stevick, Joseph Zicherman, et al. · Journal of Failure Analysis and Prevention · 7
1999 · S. A. Rishton, J. K. Varner, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 7
1982 · J. L. Romero, J. L. Ullmann, et al. · Physical Review C · 7
1978 · M.M. Gazzaly, J.B. Carroll, et al. · Physics Letters B · 7
2005 · Ming L. Yu, Allan Sagle, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2001 · S. T. Coyle, A. Fernandez, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
1991 · A.L. Sagle, B.E. Bonner, et al. · Nuclear Physics A · 6
1991 · A.L. Sagle, B.E. Bonner, et al. · Nuclear Physics A · 6
Works count: 44
Citation count: 494
H-index: 12
I10-index: 14
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