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David A. Pawlik

Observed names: D. A. Pawlik, D. PAWLIK, D. Pawlik, D.A. Pawlik, David A Pawlik
OpenAlex ID: A5022481837
Low-pressure deposition of high-quality SiO2 films by pyrolysis of tetraethylorthosilicate
1987 · F. S. Becker, D. Pawlik, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 105
A study of deep inelastic hadron-hadron collisions with a large acceptance calorimeter trigger
1982 · C. De Marzo, M. De Palma, et al. · Physics Letters B · 76
Process and film characterization of low pressure tetraethylorthosilicate–borophosphosilicate glass
1986 · F. S. Becker, D. Pawlik, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 67
Characterization of as-prepared and annealed hydrogenated carbon films
1989 · J. Gonzalez-Hernandez, B. S. Chao, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 39
Graphitization of amorphous diamondlike carbon films by ion bombardment
1988 · J. González-Hernández, R. Asomoza, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 24
Hydrogenation of AB5 and AB2 metal hydride alloys studied by in situ X-ray diffraction
2014 · L. Wang, K. Young, et al. · Journal of Alloys and Compounds · 21
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Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces
1986 · D.D. Allred, J. Gonzalez-Hernandez, et al. · Journal of materials research/Pratt's guide to venture capital sources · 19
Transmission electron microscope studies in the surface oxide on the La-containing AB2 metal hydride alloy
2016 · K. Young, B. Chao, et al. · Journal of Alloys and Compounds · 17
Structure and optical characterization of ZnxCd1−xTe thin films prepared by the close spaced vapor transport method
1991 · J. González-Hernández, O. Zelaya, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 17
Thermal Stability of W/C Multilayer Films
1985 · Yasuo Takagi, Steven A. Flessa, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 17
Effect of Alloy Composition on the Structure of Zr Based Metal Alloys
1999 · B. S. Chao, R. C. YOUNG, et al. · MRS Proceedings · 15
Comparison of low temperature polysilicon crystal growth on low cost substrates
1991 · W. Czubatyj, D. Beglau, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 15
Characterization of as-prepared and annealed W/C multilayer thin films
1992 · J. Gonzalez-Hernandez, B. S. Chao, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 13
Characterization of thermal oxides grown on TaSi2/polysilicon films
1985 · D. Pawlik, H. Oppolzer, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 12
Superconductivity in the Fluorinated YBaCuO
1987 · R. T. Young, S. R. Ovshinsky, et al. · MRS Proceedings · 10
The Relationship Between Crystal Structure and Performance as Optical Recording Media In Te-Ge-Sb Thin Films
1991 · D. Strand, J. Gonzalez-Hernandez, et al. · MRS Proceedings · 7
The effect of oxygen on the structure of annealed w/c multilayer thin films
1991 · S.S. Chao, D.A. Pawlik, et al. · Solid State Communications · 6
Thermal, Stability of W/c Multilayer Films
1985 · Yasuo Takagi, David A. Pawlik, et al. · MRS Proceedings · 5
Characterization of As-Prepared and Annealed Hydrogenated Carbon Films
1991 · J. González-Hernández, B.S. Chao, et al. · Materials science forum · 4
Superconductivity in Fluorinated Copper Oxide Ceramics
1991 · S. R. Ovshinsky, R. T. Young, et al. · Springer eBooks · 3
Raman Scattering and X-ray Diffraction Characterization of Amorphous Semiconductor Multilayer Interfaces
1985 · J. GONZALEZ, D.D. ALLRED, et al. · MRS Proceedings · 2
Characterization of as-prepared and oxidized Hf/Fe multilayer films
1990 · Yasuo Takagi, Benjamin S Chao, et al. · Thin Solid Films · 1
Structural changes induced by thermal annealing in W/C multilayers
1992 · Benjamin S. Chao, Jesus Gonzalez-Hernandez, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 23
Citation count: 495
H-index: 13
I10-index: 15
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