Get started
Author

H. Speek

Observed names: Han Speek, Speek, H.
Observed institution: University of Twente
OpenAlex ID: A5023213938
Defect-oriented testing of Josephson logic circuits and systems
2001 · H.G. Kerkhoff, H. Speek · Physica C Superconductivity · 13
A low-speed BIST framework for high-performance circuit testing
2002 · H. Speek, H.G. Kerkhoff, et al. · IEEE VLSI Test Symposium (VTS) · 9
Bridging the testing speed gap: design for delay testability
2002 · H. Speek, H.G. Kerkhoff, et al. · IEEE European Test Symposium (ETS) · 7
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation
2002 · H. Kerkhoff, R. Tangelder, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 5
DFT for Delay-Fault Diagnosis in Digital High-Speed ICs
1999 · Hans G. Kerkhoff, K. van Nee, et al. · University of Twente Research Information · 3
MCM-D Mixed-Signal Boundary-scan Testing
1997 · Hans G. Kerkhoff, G. van den Boom, et al. · University of Twente Research Information · 3
Design for Delay Testability in High-Speed Digital ICs
2001 · H.G. Kerkhoff, H. Speek, et al. · Journal of Electronic Testing · 2
Boundary-Scan Testing for Mixed — Signal MCMs
1997 · H. G. Kerkhoff, G. Boom, et al. · Springer eBooks · 2
PDF
Mixed-Signal Testing at the ASIC Design Course at Twente University
2000 · R. J. W. T. Tangelder, H. De Vries, et al. · Springer eBooks · 1
Integrated Design and Test of Mixed-Signal Circuits
1999 · Nur Engin, Hans G. Kerkhoff, et al. · Journal of Electronic Testing · 1
A Tool for Automatic Test Plan Generation for Mixed-Signal Circuits
1998 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information · 1
Automatic test plan generation for mixed-signal circuits in an integrated design and test environment
1997 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information · 1
Automatic functional mixed-signal test-pattern generation
1996 · Hans G. Kerkhoff, R.J.W.T. Tangelder, et al. · University of Twente Research Information · 1
The Testing of High-Speed Josephson-Junction Circuits
2000 · Hans G. Kerkhoff, H. Speek · University of Twente Research Information
Microelectronics Education
2000 · Tangelder, R.J.W.T., de Vries, H., et al. · Springer eBooks
BIST for delay-Faults in Digital High-Speed IC's
1999 · Hans G. Kerkhoff, H. Speek · University of Twente Research Information
Analogue Design-to-Test Integration: An Advanced Approach
1998 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information
The Mixed-Signal ASIC Design Course at Twente
1998 · R. J. W. T. Tangelder, S. H. Gerez, et al. · Springer eBooks
Advanced ATPG for Delay Faults
1997 · Hans G. Kerkhoff, Manoj Sachdev, et al. · University of Twente Research Information
An Integrated Test and Design Environment for Test Development for Mixed-Signal Circuits
1997 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information
A Tool for Automatic Test Plan Generation for Analogue and Mixed-Signal Circuits
1997 · N. Engin, Hans G. Kerkhoff, et al. · University of Twente Research Information
Timing fault detection in high-speed CPLDs
1997 · Hans G. Kerkhoff, Manoj Sachdev, et al. · University of Twente Research Information
Testing for Small Delay-Faults in Complex Programmable Logic Devices
1997 · Hans G. Kerkhoff, Manoj Sachdev, et al. · University of Twente Research Information
Design-for-test in active-substrate MCM-Ds
1997 · Hans G. Kerkhoff, G. Boom, et al. · University of Twente Research Information
Mixed-Signal Testing in a Silicon-based MCM
1997 · Hans G. Kerkhoff, G. van den Boom, et al. · University of Twente Research Information
Works count: 39
Citation count: 49
H-index: 4
I10-index: 1
Year
Topic
Type