Work

Boundary-Scan Testing for Mixed — Signal MCMs

Year: 1997

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-0-387-35311-1_42

Authors: H. G. Kerkhoff, G. Boom, H. Speek

Institution: University of Twente

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W800701192

FWCI:

Cites: 10

Cited by: 2

Related to: 10