Author

Hans G. Kerkhoff

Observed names: H G Kerkhoff, H. G. Kerhoff, H. G. Kerkhoff, H. Kerkhoff, H.G Kerkhoff, H.G. Kerkhoff, H.G. Kerkhoff., HANS G. KERKHOFF, Hans G Kerkhoff, Hans Kerkhoff, Hans. G. Kerkhoff, Kerkhoff, H., Kerkhoff, H.G., Kerkhoff, Hans G.

Institution: University of Twente

Observed institutions: Tokyo Institute of Technology, Politecnico di Torino, University of Twente, Delft University of Technology

OpenAlex ID: A5063280452

Testing Microelectronic Biofluidic Systems

2007 · Hans G. Kerkhoff · IEEE Design & Test of Computers · 70

Testable design and testing of micro-electro-fluidic arrays

2003 · H.G. Kerkhoff, M. Acar · IEEE VLSI Test Symposium (VTS) · 57

Testability analysis of analog systems

1990 · G.J. Hemink, B.W. Meijer, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 57

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Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems

2001 · Hans G. Kerkhoff, Hans P.A. Hendriks · Journal of Electronic Testing · 53

Automatic scan insertion and test generation for asynchronous circuits

2003 · F.T. Beest, A. Peeters, et al. · IEEE International Test Conference (ITC) · 32

Structural computer-aided design of current-mode CMOS logic circuits

1988 · S. Onneweer, H. Kerkhoff, et al. · IEEE International Symposium on Multiple-Valued Logic (ISMVL) · 29

Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses

2012 · Shaji Krishnan, Hans G. Kerkhoff · IEEE Design and Test · 28

Synchronous Full-Scan for Asynchronous Handshake Circuits

2003 · Frank te Beest, Ad Peeters, et al. · Journal of Electronic Testing · 27

Testing philosophy behind the micro analysis system

1999 · Hans G. Kerkhoff · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 25

Tackling test trade-offs from design, manufacturing to market using economic modeling

2002 · E.H. Volkerink, A. Khoche, et al. · IEEE International Test Conference (ITC) · 22

Analysis and design of an on-chip retargeting engine for IEEE 1687 networks

2016 · Ahmed Ibrahim, Hans G. Kerkhoff · IEEE European Test Symposium (ETS) · 21

CRISP: Cutting Edge Reconfigurable ICs for Stream Processing

2011 · Tapani Ahonen, Timon D. ter Braak, et al. · Springer eBooks · 21

On-line dependability enhancement of multiprocessor SoCs by resource management

2010 · T.D. Ter Braak, S.T. Burgess, et al. · International Symposium on System-on-Chip · 21

Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor

2010 · Hans G. Kerkhoff, Xiao Zhang · IEEE International Workshop on Electronic Design, Test and Applications (DELTA) · 20

TASTE: a tool for analog system testability evaluation

2003 · G.J. Hemink, B.W. Meijer, et al. · IEEE International Test Conference (ITC) · 19

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data

2008 · H. G. Kerkhoff, X. Zhang, et al. · VLSI design · 18

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Designing and implementing an architecture with boundary scan

1990 · R.P. van Riessen, H.G. Kerkhoff, et al. · IEEE Design & Test of Computers · 17

Multiple-valued CCD circuits

1988 · J.T. Butler, H.G. Kerkhoff · Computer · 15

Built-In Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications

2008 · Oscar J. Kuiken, Xiao Zhang, et al. · Proceedings · 14

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

1999 · Chris Feige, Jan Ten Pierick, et al. · Journal of Electronic Testing · 14

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

2019 · Ahmed M. Y. Ibrahim, Hans G. Kerkhoff · IEEE International Test Conference in Asia (ITC-Asia) · 13

Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors

2016 · Yong Zhao, Hans G. Kerkhoff · Proceedings - Asian Test Symposium/Proceedings · 13

Simulating NBTI Degradation in Arbitrary Stressed Analog/ Mixed-Signal Environments

2015 · Jinbo Wan, Hans G. Kerkhoff, et al. · IEEE Transactions on Nanotechnology · 13

VHDL-AMS Fault Simulation for Testing DNA Bio-Sensing Arrays

2006 · H.G. Kerkhoff, X. Zhang, et al. · Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ... · 13

Jitter and decision-level noise separation in A/D converters

2003 · R.J.W.T. Tangelder, H. de Vries, et al. · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 13

Works count: 373

Citation count: 1,528

H-index: 17

I10-index: 42