Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach
Year: 1999
Type: article
Source: Journal of Electronic Testing
Authors: Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald Tangelder, Hans G. Kerkhoff
Institutions: Philips (Netherlands), University of Twente
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W20935243