Work

Jitter and decision-level noise separation in A/D converters

Year: 2003

Type: conference-paper

Source: Conference proceedings - IEEE Instrumentation/Measurement Technology Conference

DOI: 10.1109/imtc.1999.776087

Authors: R.J.W.T. Tangelder, H. de Vries, R. Rosing, H.G. Kerkhoff, M. Sachdev

Institutions: University of Twente, Lancaster University, University of Waterloo

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2098028099

FWCI: 1.366

Cites: 10

Cited by: 13

Related to: 10