Work

MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation

Year: 2002

Type: conference-paper

Abstract: This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer.

Source: IEEE International Conference on Electronics, Circuits and Systems (ICECS)

DOI: 10.1109/icecs.1996.584606

Authors: H. Kerkhoff, R. Tangelder, H. Speek, N. Engin

Institution: University of Twente

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W1863661869

FWCI: 0.201

Cites: 6

Cited by: 5

Related to: 10