Author

Trevor E. Buehl

2012 · Jeonghee Kim, Nikholas G. Toledo, et al. · IEEE Electron Device Letters · 27
2012 · Laura E. Clinger, Gilles Pernot, et al. · Journal of Applied Physics · 26
2011 · Laura E. Cassels, Trevor E. Buehl, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 22
2010 · Trevor E. Buehl, James M. LeBeau, et al. · Journal of Crystal Growth · 15
2011 · Jason K. Kawasaki, Rainer Timm, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 8
2012 · Ekaterina Selezneva, Laura E. Clinger, et al. · Journal of Electronic Materials · 6
2011 · J. Buschbeck, J. Kawasaki, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 4
2011 · Trevor E. Buehl, Christopher J. Palmstrøm, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 4
2012 · Peter G. Burke, Trevor E. Buehl, et al. · Journal of Electronic Materials · 3
2012 · Peter G. Burke, Trevor E. Buehl, et al. · Journal of Electronic Materials
2011 · Nikholas G. Toledo, Samantha C. Cruz, et al. · Conference digest
Works count: 14
Citation count: 115
H-index: 6
I10-index: 4
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