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H. Ricard
Observed names:
H. RICARD,
Herve Ricard,
Herve Ricard Herve Ricard
Institution:
Tokyo Institute of Technology
Observed institutions:
Tokyo Institute of Technology,
Université de Bordeaux,
Université Bordeaux-I
OpenAlex ID:
A5031460733
Thin films of solid solutions of fluorides for epitaxy on III–V semiconductors
1986
·
A.S. Barrière
, G. Couturier
, et al.
·
Surface Science
·
15
A study of the chemical oxide/InP interface by deep-level transient spectroscopy
1987
·
H. Ricard
, G. Couturier
, et al.
·
Journal of Applied Physics
·
13
Electrical Properties of Gallium Fluoride(GaF3)/GaAs Interface with and without Sulfur Treatment
1990
·
Herve Ricard
, Kwang Ho Kim
, et al.
·
Japanese Journal of Applied Physics
·
12
Electrical properties of SrF2/InP (100) diodes and SrF2 thin films
1987
·
G. Couturier
, A. Chaouki
, et al.
·
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
·
12
Improvement of interface electronic properties of GaF3/GaAs MIS structures
1992
·
H. Ricard
, K. Aizawa
, et al.
·
Applied Surface Science
·
6
Investigation of the CaF2/p-type Si(100) interface by conductance and deep level transient spectroscopy
1991
·
G. Couturier
, H. Ricard
, et al.
·
Solid-State Electronics
·
5
Lattice Parameter Control of Epitaxially Grown Hexagonal LaF3 Films on GaAs(111) Substrates by Incorporation of Orthorhombic YF3
1992
·
Kouji Aizawa
, Herve Ricard Herve Ricard
, et al.
·
Japanese Journal of Applied Physics
·
3
PDF
Electrical Properties of Gallium Fluoride (GaF3)/GaAs Interface with and without Sulfur Treatment
1990
·
H. RICARD
, K. H. KIM
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
·
1
Studies of fluorides/sulfur-treated GaAs interfaces and their applications to MIS devices
1992
·
H. Ricard
Electrical properties of rare-earth mixed-fluorides (Y x La 1-x F 3 )/GaAs structures.
1992
·
会沢康治
, 神田和重
, et al.
·
応用物理学関係連合講演会講演予稿集
Thin films of solid solutions of fluorides for epitaxy on III–V semiconductors
1986
·
A.S. Barrière
, G. Couturier
, et al.
·
Surface Science Letters
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Works count:
11
Citation count:
67
H-index:
5
I10-index:
4
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