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Simone Brizzi

Observed names: S Brizzi, S. Brizzi
OpenAlex ID: A5064592665
Study of InP Surfaces after Wet Chemical Treatments
2013 · D. Cuypers, D. H. van Dorp, et al. · ECS Journal of Solid State Science and Technology · 34
Graphene oxide monolayers as atomically thin seeding layers for atomic layer deposition of metal oxides
2015 · Amirhasan Nourbakhsh, Christoph Adelmann, et al. · Nanoscale · 28
Sacrificial Self-Assembled Monolayers for the Passivation of GaAs (100) Surfaces and Interfaces
2016 · Daniel Cuypers, Claudia Fleischmann, et al. · Chemistry of Materials · 26
Analysis of nitrogen species in titanium oxynitride ALD films
2016 · Małgorzata Sowińska, Simone Brizzi, et al. · Applied Surface Science · 24
Analysis of titanium species in titanium oxynitride films prepared by plasma enhanced atomic layer deposition
2016 · Małgorzata Kot, Karsten Henkel, et al. · Surface and Coatings Technology · 21
Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO2 films
2015 · Silma Alberton Corrêa, Simone Brizzi, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 18
A spectroscopic comparison of IGZO thin films and the parent In2O3, Ga2O3, and ZnO single crystals
2016 · J Haeberle, S Brizzi, et al. · Materials Research Express · 15
Amorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation
2019 · Dennis H. van Dorp, Laura Nyns, et al. · ACS Applied Electronic Materials · 9
On the scalability of doped hafnia thin films
2014 · C. Adelmann, T. Schram, et al. · Applied Physics Letters · 6
Depicting the Electronic Structure of HfO2 Films by Spectroscopic Techniques
2016 · Silma Alberton Corrêa, Simone Brizzi, et al. · ECS Transactions · 3
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Study of InP Surfaces after Wet Chemical Treatments
2013 · Daniel Cuypers, Dennis H. van Dorp, et al. · ECS Transactions · 3
Depicting the Electronic Structure of HfO2 Films by Spectroscopic Techniques
2016 · Silma Alberton Corrêa, Simone Brizzi, et al. · ECS Meeting Abstracts
Comparison of charge neutrality level of Cu/CuO/HfO2 and Si/SiO2/HfO2
2015 · Zied Rouissi, Simone Brizzi, et al.
Charging effect in HfO2 films deposited on SiO2/Si by atomic layer deposition
2014 · Silma Alberton Corrêa, Simone Brizzi, et al. · Verhandlungen der Deutschen Physikalischen Gesellschaft
Study of InP Surfaces After Wet Chemical Treatments
2013 · Daniel Cuypers, Dennis H. van Dorp, et al. · ECS Meeting Abstracts
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CVD and ALD deposited hafnia: an XPS study
2013 · Simone Brizzi, Massimo Tallarida, et al.
Works count: 16
Citation count: 187
H-index: 8
I10-index: 7
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