Author

M. Taneya

Observed names: M Taneya, M. TANEYA, Mototaka Taneya, Mototaka Taneya Mototaka Taneya, Taneya, Mototaka
OpenAlex ID: A5067665461
1999 · H. Harima, T. Inoue, et al. · Applied Physics Letters · 66
1999 · Takayuki Yuasa, Yoshihiro Ueta, et al. · Japanese Journal of Applied Physics · 52
1989 · Mototaka Taneya, Yoshimasa Sugimoto, et al. · Japanese Journal of Applied Physics · 44
1985 · M. Taneya, M. Matsumoto, et al. · Applied Physics Letters · 44
1984 · A. Sasaki, M. Taneya, et al. · IEEE Transactions on Electron Devices · 43
1990 · Yuji Hiratani, Yoshimasa Ohki, et al. · Japanese Journal of Applied Physics · 41
1998 · H. Harima, T. Inoue, et al. · Applied Physics Letters · 39
1990 · Y. Sugimoto, M. Taneya, et al. · Journal of Applied Physics · 33
1989 · K. Akita, M. Taneya, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 28
1991 · Y. Sugimoto, M. Taneya, et al. · Journal of Applied Physics · 27
1987 · M. Matsumoto, M. Taneya, et al. · Applied Physics Letters · 25
2003 · V.Z. Tronciu, M. Yamada, et al. · IEEE Journal of Quantum Electronics · 20
1999 · H. Harima, T. Inoue, et al. · physica status solidi (b) · 19
1990 · Y. Sugimoto, K. Akita, et al. · Applied Physics Letters · 19
1990 · Mototaka Taneya, Yoshimasa Sugimoto, et al. · Japanese Journal of Applied Physics · 18
2004 · Shigetoshi Ito, Yukio Yamasaki, et al. · Japanese Journal of Applied Physics · 17
2003 · T. Ohno, S. Ito, et al. · Applied Physics Letters · 17
1990 · M. Taneya, K. Akita, et al. · Applied Physics Letters · 17
1991 · Y. Sugimoto, M. Taneya, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 16
1991 · Y. Sugimoto, K. Akita, et al. · Review of Scientific Instruments · 15
1990 · M. Taneya, Y. Sugimoto, et al. · Journal of Applied Physics · 13
1990 · H. Hidaka, K. Akita, et al. · Electronics Letters · 11
1991 · K. Akita, Yoshimasa Sugimoto, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
Works count: 55
Citation count: 863
H-index: 17
I10-index: 27
Year
Topic
Type