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Ciby Thuruthiyil

Observed names: C. Thuruthiyil, Ciby T. Thuruthiyil
OpenAlex ID: A5069578595
Extraction of Self-Heating Free I-V Curves Including the Substrate Current of PD SOI MOSFETs
2007 · Qiang Chen, Zhi-Yuan Wu, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 11
Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables
2012 · Bo Yu, Xin Li, et al. · Custom Integrated Circuits Conference · 9
Critical current (ICRIT) based SPICE model extraction for SRAM cell
2008 · Qiang Chen, Sriram Balasubramanian, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 7
Small-signal analytical MOSFET model for microwave frequency applications
2000 · Anisha Goswami, Anju Agrawal, et al. · Microwave and Optical Technology Letters · 7
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History-effect-conscious SPICE model extraction for PD-SOI technology
2005 · J.-S. Goo, J.X. An, et al. · IEEE International SOI Conference (SOI) · 6
Off-state leakage current modeling in low-power/high-performance partially-depleted (PD) floating-body (FB) SOI MOSFETs
2008 · Qiang Chen, Jung-Suk Goo, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 4
Impact of Gate Induced Drain Leakage and Impact Ionization Currents on Hysteresis Modeling of PD SOI Circuits
2007 · Jia An, Q Chen, et al. · TechConnect Briefs · 4
On Idlow with Emphasis on Speculative SPICE Modeling
2006 · Qiang Chen, Zhiyuan Wu, et al. · TechConnect Briefs · 2
Statistical Compact Modeling and Si Verification Methodology
2006 · Vineet Wason, Judy An, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 2
SPICE parameter extraction and RO validation of a 65nm SOI technology
2008 · J.-S. Goo, Q. Chen, et al. · IEEE International SOI Conference (SOI) · 1
An A Priori Hysteresis Modeling Methodology for Improved Efficiency and Model Accuracy in Advanced PD SOI Technologies
2005 · Qiang Chen, Jung-Suk Goo, et al. · 1
Extraction of speculative SOI MOSFET models using self-heating-free targets
2008 · Qiang Chen, Zhi-Yuan Wu, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology
Impact of stress on various circuit characteristics in 65nm PDSOI technology
2007 · Sushant Suryagandh, Mayank Gupta, et al. · European Solid-State Circuits Conference (ESSCIRC)
Impact of stress on various circuit characteristics in 65nm PDSOI technology
2007 · Sushant Suryagandh, Mayank Gupta, et al. · European Solid-State Device Research Conference
Works count: 14
Citation count: 54
H-index: 5
I10-index: 1
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