Work

Extraction of Self-Heating Free I-V Curves Including the Substrate Current of PD SOI MOSFETs

Year: 2007

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.2007.374498

Authors: Qiang Chen, Zhi-Yuan Wu, Richard Y.K. Su, Jung-Suk Goo, Ciby Thuruthiyil, Martin Radwin, Niraj Subba, Sushant Suryagandh, Tran Ly, Vineet Wason, Judy X. An, Ali B. Icel

Institution: Advanced Micro Devices (United States)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2030629033

FWCI: 4.519

Cites: 8

Cited by: 11

Related to: 10