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Nick Valckx
Observed names:
Valckx, N.,
Valckx, Nick
Observed institutions:
Kaneka (United States),
IMEC,
KU Leuven
OpenAlex ID:
A5077455232
Trends in total reflection X-ray fluorescence spectrometry for metallic contamination control in semiconductor nanotechnology
2006
·
David Hellin
, Stefan De Gendt
, et al.
·
Spectrochimica Acta Part B Atomic Spectroscopy
·
49
High Efficiency Silver-Free Heterojunction Silicon Solar Cell
2012
·
José Luis Hernández
, Kunta Yoshikawa
, et al.
·
Japanese Journal of Applied Physics
·
39
PDF
High Efficiency Copper Electroplated Heterojunction Solar Cells and Modules – The Path towards 25% Cell Efficiency
2013
·
Hernández, J.L.
, Adachi, D.
, et al.
·
EU PVSEC
·
27
High Efficiency Copper Electroplated Heterojunction Solar Cells
2012
·
Hernández, J.L.
, Adachi, D.
, et al.
·
EU PVSEC
·
20
Lossless Solvent-based Extension Implant Strip
2009
·
Rita Vos
, Geert Mannaert
, et al.
·
ECS Transactions
·
8
PDF
Progress & Challenges in Thin-Film Silicon Photovoltaics: Heterojunctions & Multijunctions
2015
·
Yamamoto, K.
, Adachi, D.
, et al.
·
EU PVSEC
·
7
Investigation of Metallic Contamination Analysis Using Vapor Phase Decomposition – Droplet Collection – Total Reflection X-Ray Fluorescence (VPD-DC-TXRF) for Pt-Group Elements on Silicon Wafers
2007
·
David Hellin
, Nick Valckx
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
6
Study of the Etching Mechanism of Heavily Doped Si in HF
2012
·
Nick Valckx
, Daniel Cuypers
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
·
5
Electrochemical and Analytical Study of the Si Etching Mechanism in HF
2009
·
Nick Valckx
, Rita Vos
, et al.
·
ECS Transactions
·
1
PDF
HF etching mechanism of heavily doped Si.
2011
·
Nick Valckx
Study of the etching mechanism of heavily n-type doped Si in HF solutions
2010
·
Daniel Cuypers
, Nick Valckx
, et al.
Electrochemical and Analytical Study of the Si Etching Mechanism in HF
2009
·
Nick Valckx
, Rita Vos
, et al.
·
ECS Meeting Abstracts
PDF
Lossless Solvent-Based Extension Implant Strip
2009
·
Rita Vos
, Geert Mannaert
, et al.
·
ECS Meeting Abstracts
PDF
Electrochemical and Analytical Study of the Si Etching Mechanism in HF
2009
·
Nick Valckx
, Rita Vos
, et al.
·
ECS Meeting Abstracts
PDF
Investigation of Metallic Contamination Analysis Using Vapor Phase Decomposition – Droplet Collection – Total Reflection X-Ray Fluorescence (VPD-DC-TXRF) for Pt-Group Elements on Silicon Wafers
2007
·
David Hellin
, Nick Valckx
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
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Works count:
16
Citation count:
162
H-index:
6
I10-index:
4
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