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Morikazu Konishi

Performance of the new high mass resolution time of flight atom probe
1981 · Osamu Nishikawa, Kazuaki Kurihara, et al. · Review of Scientific Instruments · 53
Binding states of Ga and Sn on W and Mo: Structures, evaporation field and its temperature dependence
1980 · M. Wada, M. Konishi, et al. · Surface Science · 21
Polarizabilities and binding energies of Ga on W and post-field-ionization of Ga
1981 · M. Konishi, M. Wada, et al. · Surface Science · 20
FIM observations of W, Ga and Sn structures on W and Mo {001} surfaces
1980 · O. Nishikawa, M. Wada, et al. · Surface Science · 12
Characteristics of a helium field ion gun
1988 · Morikazu Konishi, Masaaki Takizawa, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 8
Electron Beam Induced Damage of MOS Gate Oxide
1998 · Morikazu Konishi, Michitaka Kubota, et al. · Japanese Journal of Applied Physics · 4
Studies on correction accuracy of proximity effect for the pattern area density method in electron beam direct writing
1996 · Takashi Kasuga, Morikazu Konishi, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 4
Reply to the comments by D.R. Kingham on “polarizabilities and binding energies of Ga on W and post-field-ionization of Ga”
1981 · M. Konishi, M. Wada, et al. · Surface Science · 3
Nissin Ion Doping System—H[sub 2]+] Implantation for Silicon Layer Exfoliation
2011 · S. Cherekdjian, R. O. Maschmeyer, et al. · AIP conference proceedings · 1
A Focused He+ Ion Beam with a High Angular Current Density
1992 · Hiroshi Hiroshima, Masanori Komuro, et al. · Japanese Journal of Applied Physics · 1
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Large diameter ion beam implantation system
1987 · K. Matsuda, F. Fukumaru, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1
Sputtering of Metals with 20 keV O2 +; Characteristic Etch Patterns, Sputtered Atom Yields and Secondary Ion Mass Spectra
1982 · K. Tsunoyama, T. Suzuki, et al. · Springer series in chemical physics · 1
Erratum to : The Measurement of Mean Sojourn Time of Molecules in Practical Vacuum Systems
1980 · Morikazu KONISHI, Minoru WADA, et al. · Shinku · 1
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Electron Beam Induced Damage of MOS Gate Oxide
1997 · Morikazu Konishi, Michitaka Kubota, et al. · International Conference on Solid State Devices and Materials (SSDM)
Performance of a Gas Phase Focused Ion Beam System : Lithography Technology :
1989 · M. Konishi, Masaaki Takizawa · JJAP series
Reply to the comments by D.R. Kingham on “polarizabilities and binding energies of Ga On W and post-field-ionization of Ga”
1981 · M. Konishi, M. Wada, et al. · Surface Science Letters
Polarizabilities and binding energies of Ga on W and post-field-ionization of Ga
1981 · M. Konishi, M. Wada, et al. · Surface Science Letters
Works count: 17
Citation count: 130
H-index: 5
I10-index: 4
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