Author

S. Wada

Observed names: S Wada, S.-I. Wada
Institution: NEC (Japan)
Observed institution: NEC (Japan)
OpenAlex ID: A5111081689
2004 · Y. Suzuki, Z. Yamazaki, et al. · IEEE Journal of Solid-State Circuits · 52
1990 · Y. Hayashi, S. Wada, et al. · Symposium on VLSI Technology · 26
1991 · Y. Hayashi, K. Oyama, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 21
2004 · Y. Suzuki, Y. Arnamiya, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 14
1996 · T. Maeda, K. Numata, et al. · IEEE Journal of Solid-State Circuits · 14
1999 · T. Maeda, S. Wada, et al. · IEEE Journal of Solid-State Circuits · 12
2002 · S. Wada, T. Maeda, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 7
1999 · S. Wada, J. Yamazaki, et al. · IEEE Transactions on Electron Devices · 6
2002 · T. Maeda, S. Wada, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 5
2003 · N. Yoshida, M. Ishizaka, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 4
2002 · K. Numata, M. Fujii, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 4
1985 · T. Yamada, S. Wada, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 4
2002 · S. Wada, J. Yamazaki, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 3
2008 · N. Yoshida, H. Noguchi, et al. · European Conference on Optical Communication · 2
1998 · S. Wada, N. Furuhata, et al. · IEEE Transactions on Electron Devices · 2
2003 · M. Komatsu, T. Kobayashi, et al. · IEEE International Symposium on Circuits and Systems proceedings · 1
2002 · S. Wada, N. Furuhata, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 1
1998 · M. Fujii, K. Numata, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1
1997 · S.-I. Wada, T. Nakamura · Proceedings - International Symposium for Testing and Failure Analysis · 1
1992 · S Wada, S Takahashi, et al. · Semiconductor Science and Technology · 1
Works count: 34
Citation count: 231
H-index: 8
I10-index: 8
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