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Author

Yuusuke Ohtani

Observed names: Y Ohtani, Y. Ohtani
Observed institution: Kanazawa Institute of Technology
OpenAlex ID: A5111463737
Effect of thickness on the stability of transparent conducting impurity‐doped ZnO thin films in a high humidity environment
2006 · Tadatsugu Minami, Toshihiro Miyata, et al. · physica status solidi (RRL) - Rapid Research Letters · 71
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New Transparent Conducting Al-doped ZnO Film Preparation Techniques for Improving Resistivity Distribution in Magnetron Sputtering Deposition
2006 · Tadatsugu Minami, Toshihiro Miyata, et al. · Japanese Journal of Applied Physics · 71
Stability of nano-thick transparent conducting oxide films for use in a moist environment
2007 · Toshihiro Miyata, Yuusuke Ohtani, et al. · Thin Solid Films · 42
Transparent conducting Al-doped ZnO thin films prepared by magnetron sputtering with dc and rf powers applied in combination
2007 · Tadatsugu Minami, Yuusuke Ohtani, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 41
Stability in a high humidity environment of TCO thin films deposited at low temperatures
2007 · Tadatsugu Minami, Takeshi Kuboi, et al. · physica status solidi (a) · 39
Optimization of aluminum‐doped ZnO thin‐film deposition by magnetron sputtering for liquid crystal display applications
2007 · Tadatsugu Minami, Toshihiro Miyata, et al. · physica status solidi (a) · 30
Development of a scanning atom probe and atom-by-atom mass analysis of diamonds
1998 · O. Nishikawa, T. Sekine, et al. · Applied Physics A · 19
Atomic level analysis of electron emitter surfaces by the scanning atom probe
1999 · O Nishikawa, K Maeda, et al. · Applied Surface Science · 11
Atom-by-atom analysis of microtip emitter surfaces by the scanning atom probe
1999 · O. Nishikawa, M. Watanabe, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
Atomic level analysis of silicon emitters utilizing the scanning atom probe
2000 · O. Nishikawa, M. Watanabe, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 5
P‐223L: Late‐News Poster : New Techniques for Producing AZO Thin Films Suitable for ITO Transparent Electrode Applications in LCDs
2006 · Tadatsugu Minami, Toshihiro Miyata, et al. · SID Symposium Digest of Technical Papers · 2
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Atomic-by-atom analysis of micro tip emitter surfaces by the scanning atom probe
2002 · O. Nishikawa, M. Watanabe, et al. · International Vacuum Nanoelectronics Conference
Atomic Investigation of Individual Apexes of Diamond Emitters by a Scanning Atom Probe
1997 · O. Nishikawa, T. Sekine, et al. · International Vacuum Nanoelectronics Conference
Works count: 13
Citation count: 337
H-index: 8
I10-index: 8
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