Work

Atomic Investigation of Individual Apexes of Diamond Emitters by a Scanning Atom Probe

Year: 1997

Type: conference-paper

Source: International Vacuum Nanoelectronics Conference

DOI: 10.1109/ivmc.1997.627496

Authors: O. Nishikawa, T. Sekine, Y. Ohtani, K. Maeda, M. Iwatsuki, S. Aoki, J. Itoh, K. Yamanaka

Institutions: Kanazawa Institute of Technology, JEOL (Japan), Tohoku University

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1589405877

FWCI:

Cites: 7

Cited by:

Related to: 10