Work

Atom-by-atom analysis of microtip emitter surfaces by the scanning atom probe

Year: 1999

Type: article

Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

DOI: 10.1116/1.590604

Authors: O. Nishikawa, M. Watanabe, Y. Ohtani, K. Maeda, K. Tanaka, T. Sekine, J. Itoh

Institution: Kanazawa Institute of Technology

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2000326211

FWCI: 4.979

Cites: 6

Cited by: 6

Related to: 10