Author

L. A. Bailón

Observed names: L Bailon, L Bailón, L. A. BAILÓN, L. Bailon, L. Bailón, L. Bailón, L.A. Bailon, L.A. Bailón, LA Bailón
OpenAlex ID: A5111738693
1992 · J. Barbolla, S. Dueñas, et al. · Solid-State Electronics · 80
2002 · J. M. Hernández-Mangas, J. Arias, et al. · Journal of Applied Physics · 46
2013 · H. Castán, E. Pérez, et al. · Journal of Applied Physics · 39
2007 · S. Dueñas, H. Castán, et al. · Journal of The Electrochemical Society · 39
1987 · S. Dueñas, M. Jaraiz, et al. · Journal of Applied Physics · 30
1995 · J.E. Rubio, L.A. Marqués, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 19
2015 · E. Pérez, H. Castán, et al. · Applied Physics Letters · 18
2009 · H. García, S. Dueñas, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 18
2009 · S. Dueñas, H. Castán, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 18
1994 · L. Pelaz, J.L. Orantes, et al. · IEEE Transactions on Electron Devices · 18
2007 · S Dueñas, H Castán, et al. · Semiconductor Science and Technology · 17
2013 · Salvador Duenas, E. Perez, et al. · Spanish Conference on Electron Devices · 16
2011 · A. Gómez, H. Castán, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 16
2007 · S. Dueñas, H. Castán, et al. · Microelectronics Reliability · 16
2013 · H García, H Castán, et al. · Semiconductor Science and Technology · 15
1986 · M. Jaraiz, S. Dueñas, et al. · Solid-State Electronics · 13
1993 · J. Vicente, L. Enríquez, et al. · Journal of The Electrochemical Society · 12
1990 · A. de Dios, E. Castán, et al. · Solid-State Electronics · 12
2008 · S. Dueñas, H. Castán, et al. · Journal of The Electrochemical Society · 10
2000 · M Jaraiz, E Rubio, et al. · Materials Science in Semiconductor Processing · 10
Works count: 81
Citation count: 710
H-index: 16
I10-index: 25
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