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T. Pavelka

Observed names: T Pavelka, Tibor PAVELKA, Tibor Pavelka, Tibor Pavelka Tibor Pavelka
Institution: Semilab (Hungary)
OpenAlex ID: A5111762310
In situ bulk lifetime measurement on silicon with a chemically passivated surface
1993 · T.S. Horányi, T. Pavelka, et al. · Elsevier eBooks · 142
Correlation of the concentration of the carbon-associated radiation damage levels with the total carbon concentration in silicon
1988 · G. Ferenczi, C. A. Londos, et al. · Journal of Applied Physics · 60
Isothermal frequency scan DLTS
1986 · G. Ferenczi, J. Boda, et al. · physica status solidi (a) · 50
Silicon epitaxial layer recombination and generation lifetime characterization
2003 · D.K. Schroder, B.D. Choi, et al. · IEEE Transactions on Electron Devices · 33
Quantitative copper measurement in oxidized p-type silicon wafers using microwave photoconductivity decay
2005 · H. Väinölä, E. Saarnilehto, et al. · Applied Physics Letters · 31
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Injection Level Spectroscopy: A Novel Non-Contact Contamination Analysis Technique in Silicon
1991 · George Ferenczi, Tibor Pavelka Tibor Pavelka, et al. · Japanese Journal of Applied Physics · 17
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Problems and Possibilities of Comparing Different Lifetime Measuring Instruments and Techniques
1998 · T Pavelka · 9
Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics
2010 · J. L. Everaert, E. Rosseel, et al. · Applied Physics Letters · 8
Comparative study on emitter sheet resistivity measurements for inline quality control
2003 · E. Ruland, P. Fath, et al. · World Conference on Photovoltaic Energy Conversion · 8
Carrier Lifetime Analysis by Photoconductance Decay and Free Carrier Absorption Measurements
2001 · H.-J. Schulze, A. Frohnmeyer, et al. · Journal of The Electrochemical Society · 8
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Ballistic electron emission microscopy of Schottky diodes on RF-plasma-treated silicon
1993 · Lidia Quattropani, Katalin Solt, et al. · Applied Surface Science · 8
Carrier Lifetime Measurements in Silicon for Photovoltaic Applications
2007 · Tibor Pavelka, Aron Pap, et al. · ECS Transactions · 7
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Metrology and High Resolution Mapping of Shallow Junctions Formed by Low Energy Implant Processes
2006 · Eric Don, Aron Pap, et al. · AIP conference proceedings · 6
Measuring the Minority-Carrier Diffusion Length of n-Type In0.53Ga0.47As Epilayers Using Surface Photovoltage
2017 · Ping Li, Hengjing Tang, et al. · Journal of Electronic Materials · 5
Investigation of deep levels and precipitates related to molybdenum in silicon by DLTS and scanning infrared microscopy
2000 · A Sandhu, T Ogikubo, et al. · Journal of Crystal Growth · 5
22nm node p+ USJ defect analysis with various PAI and HALO structures using laser annealing
2010 · John Borland, Milkos Tallian, et al. · International Conference on Advanced Thermal Processing of Semiconductors · 3
Novel Noncontact Approach to Characterization of Mobility in Inversion Layers Using Corona Charging of Dielectric and SPV Monitoring of Sheet Resistance
2010 · JL. Everaert, E. Rosseel, et al. · ECS Transactions · 3
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Junction Photovoltage Metrology and High Resolution Mapping of Ion Implants Electrically Isolated from the Wafer Surface
2008 · Ferenc Korsós, Krisztian Kis-Szabo, et al. · AIP conference proceedings · 3
Measurement of Copper in p-Type Silicon Using Charge-Carrier Lifetime Methods
2005 · Marko Yli-Koski, Hele Savin, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 3
Investigation of Recombination Properties of Ti Double Donor in Si
1993 · G. Ferenczi, T. Pavelka, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 3
Dispersive microwave transient spectroscopy of deep levels in semiconductors
1989 · D. Huber, P. Eichinger, et al. · Materials Science and Engineering B · 3
Comparison of Silicon Surface Preparation Methods for Measurement of Minority Carrier Lifetime using the Microwave Photo-conductive Decay (μ-PCD) coupled with Continuous Corona Charge (Charge-PCD)
2009 · Tibor Pavelka, Aron Pap, et al. · ECS Transactions · 2
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Control of laser induced interface traps with in-line corona charge metrology
2008 · J-L. Everaert, E. Rosseel, et al. · International Conference on Advanced Thermal Processing of Semiconductors · 2
Ultra-Shallow Junctions Fabrication by Plasma Immersion Implantation on PULSION® Followed by Laser Thermal Processing
2008 · Frank Torregrosa, Hasnaa Etienne, et al. · AIP conference proceedings · 2
Monitoring plasma nitridation of HfSiOx by corona charge measurements
2007 · J-L. Everaert, X. Shi, et al. · Microelectronic Engineering · 2
Works count: 47
Citation count: 440
H-index: 8
I10-index: 6
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